DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Donghyeong | ko |
dc.contributor.author | Jeong, Kwang-Yong | ko |
dc.contributor.author | Kim, Jinhyung | ko |
dc.contributor.author | Ee, Ho-Seok | ko |
dc.contributor.author | Kang, Ju-Hyung | ko |
dc.contributor.author | Park, Hong-Gyu | ko |
dc.contributor.author | Seo, Min-Kyo | ko |
dc.date.accessioned | 2017-12-05T02:08:52Z | - |
dc.date.available | 2017-12-05T02:08:52Z | - |
dc.date.created | 2017-11-14 | - |
dc.date.created | 2017-11-14 | - |
dc.date.created | 2017-11-14 | - |
dc.date.issued | 2017-11 | - |
dc.identifier.citation | PHYSICAL REVIEW APPLIED, v.8, no.5, pp.054024 | - |
dc.identifier.issn | 2331-7019 | - |
dc.identifier.uri | http://hdl.handle.net/10203/227509 | - |
dc.description.abstract | Light scattering by nanostructures has facilitated research on various optical phenomena and applications by interfacing the near fields and free-propagating radiation. However, direct quantitative measurement of far-field scattering by a single nanostructure on the wavelength scale or less is highly challenging. Conventional back-focal-plane imaging covers only a limited solid angle determined by the numerical aperture of the objectives and suffers from optical aberration and distortion. Here, we present a quantitative measurement of the differential far-field scattering cross section of a single nanostructure over the full hemisphere. In goniometer-based far-field scanning with a high signal-to-noise ratio of approximately 27.4 dB, weak scattering signals are efficiently isolated and detected under total-internal-reflection illumination. Systematic measurements reveal that the total and differential scattering cross sections of a Au nanorod are determined by the plasmonic Fabry-Perot resonances and the phase-matching conditions to the free-propagating radiation, respectively. We believe that our angle-resolved far-field measurement scheme provides a way to investigate and evaluate the physical properties and performance of nano-optical materials and phenomena. | - |
dc.language | English | - |
dc.publisher | American Physical Society | - |
dc.title | Quantitative and Isolated Measurement of Far-Field Light Scattering by a Single Nanostructure | - |
dc.type | Article | - |
dc.identifier.wosid | 000414853600004 | - |
dc.identifier.scopusid | 2-s2.0-85034103640 | - |
dc.type.rims | ART | - |
dc.citation.volume | 8 | - |
dc.citation.issue | 5 | - |
dc.citation.beginningpage | 054024 | - |
dc.citation.publicationname | PHYSICAL REVIEW APPLIED | - |
dc.identifier.doi | 10.1103/PhysRevApplied.8.054024 | - |
dc.contributor.localauthor | Seo, Min-Kyo | - |
dc.contributor.nonIdAuthor | Jeong, Kwang-Yong | - |
dc.contributor.nonIdAuthor | Ee, Ho-Seok | - |
dc.contributor.nonIdAuthor | Kang, Ju-Hyung | - |
dc.contributor.nonIdAuthor | Park, Hong-Gyu | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | NANOPARTICLES | - |
dc.subject.keywordPlus | ANTENNAS | - |
dc.subject.keywordPlus | GENERATION | - |
dc.subject.keywordPlus | MICROSCOPY | - |
dc.subject.keywordPlus | EMISSION | - |
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