Versatile Variable Temperature and Magnetic Field Scanning Probe Microscope for Advanced Material Research

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dc.contributor.authorJung, Jin-Ohko
dc.contributor.authorChoi, Seok Hwanko
dc.contributor.authorLee, Yeonghoonko
dc.contributor.authorKim, Jinwooko
dc.contributor.authorSon, DongHyeonko
dc.contributor.authorLee, Jhinhwanko
dc.date.accessioned2017-11-21T04:07:36Z-
dc.date.available2017-11-21T04:07:36Z-
dc.date.created2017-11-13-
dc.date.created2017-11-13-
dc.date.issued2017-10-
dc.identifier.citationREVIEW OF SCIENTIFIC INSTRUMENTS, v.88, no.10, pp.103702-
dc.identifier.issn0034-6748-
dc.identifier.urihttp://hdl.handle.net/10203/227222-
dc.description.abstractWe have built a variable temperature scanning probe microscope (SPM) that covers 4.6 K-180 K and up to 7 T whose SPM head fits in a 52 mm bore magnet. It features a temperature-controlled sample stage thermally well isolated from the SPM body in good thermal contact with the liquid helium bath. It has a 7-sample-holder storage carousel at liquid helium temperature for systematic studies using multiple samples and field emission targets intended for spin-polarized spectroscopic-imaging scanning tunneling microscopy (STM) study on samples with various compositions and doping conditions. The system is equipped with a UHV sample preparation chamber and mounted on a two-stage vibration isolation system made of a heavy concrete block and a granite table on pneumatic vibration isolators. A quartz resonator (qPlus)-based non-contact atomic force microscope (AFM) sensor is used for simultaneous STM/AFM operation for research on samples with highly insulating properties such as strongly underdoped cuprates and strongly correlated electron systems. Published by AIP Publishing.-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.subjectBI2SR2CACU2O8+DELTA-
dc.titleVersatile Variable Temperature and Magnetic Field Scanning Probe Microscope for Advanced Material Research-
dc.typeArticle-
dc.identifier.wosid000414174000022-
dc.identifier.scopusid2-s2.0-85032375335-
dc.type.rimsART-
dc.citation.volume88-
dc.citation.issue10-
dc.citation.beginningpage103702-
dc.citation.publicationnameREVIEW OF SCIENTIFIC INSTRUMENTS-
dc.identifier.doi10.1063/1.4996175-
dc.contributor.localauthorLee, Jhinhwan-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordPlusBI2SR2CACU2O8+DELTA-
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