Layered Fe-based superconductors and CDW materials investigated with medium field variable temperature scanning tunneling microscopy
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Jhinhwan | ko |
| dc.date.accessioned | 2017-11-21T03:06:05Z | - |
| dc.date.available | 2017-11-21T03:06:05Z | - |
| dc.date.created | 2017-11-15 | - |
| dc.date.issued | 2014-07 | - |
| dc.identifier.citation | International Conference on Electron Microscopy | - |
| dc.identifier.uri | http://hdl.handle.net/10203/227166 | - |
| dc.language | English | - |
| dc.publisher | International Conference on Electron Microscopy | - |
| dc.title | Layered Fe-based superconductors and CDW materials investigated with medium field variable temperature scanning tunneling microscopy | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | International Conference on Electron Microscopy | - |
| dc.identifier.conferencecountry | II | - |
| dc.identifier.conferencelocation | University of Delhi, Delhi | - |
| dc.contributor.localauthor | Lee, Jhinhwan | - |
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