Advanced Cavity Perturbation Method for Continuous Measurement of Microwave Properties
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Chul-ki | ko |
| dc.contributor.author | Park, Seong-Ook | ko |
| dc.date.accessioned | 2017-10-23T01:07:18Z | - |
| dc.date.available | 2017-10-23T01:07:18Z | - |
| dc.date.created | 2017-09-25 | - |
| dc.date.created | 2017-09-25 | - |
| dc.date.issued | 2017-06-27 | - |
| dc.identifier.citation | ISMOT 2017 (International Symposium on Microwave and Optical Technology) | - |
| dc.identifier.uri | http://hdl.handle.net/10203/226243 | - |
| dc.description.abstract | This paper propose more accurate measurement method to calculate complex permittivity and permeability of dielectricmagnetic materials for continuous microwave properties. | - |
| dc.language | English | - |
| dc.publisher | KIEES/University of Nevada/POSTECH | - |
| dc.title | Advanced Cavity Perturbation Method for Continuous Measurement of Microwave Properties | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | ISMOT 2017 (International Symposium on Microwave and Optical Technology) | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | Kbiz Conference Hall,Seoul | - |
| dc.contributor.localauthor | Park, Seong-Ook | - |
| dc.contributor.nonIdAuthor | Kim, Chul-ki | - |
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