Browse "CE-Patent(특허)" by Author Sohn, Hoon

Showing results 10 to 16 of 16

10
System for precision measurement of structure and method therefor

Kwon, Nam-Yeol; Kang, Doo-Young; Park, Seung-Beom; Kim, Min-Jae; Moon, Jae-Min; Lim, Hyeon-Muk; Kang, Jin-Seok; et al

11
SYSTEM FOR PRECISION MEASUREMENT OF STRUCTURE AND METHOD THEREFOR

Sohn, Hoon; Kim, Ki-Young; Koo, Gun-Hee; Choi, Jae-Muk; Chung, Jun-Yeon

12
SYSTEM FOR PRECISION MEASUREMENT OF STRUCTURE AND METHOD THEREFOR

Sohn, Hoon; Kim, Ki-Young; Koo, Gun-Hee; Choi, Jae-Muk; Chung, Jun-Yeon

13
SYSTEM FOR PRECISION MEASUREMENT OF STRUCTURE AND METHOD THEREFOR

Sohn, Hoon; Kim, Ki-Young; Koo, Gun-Hee; Choi, Jae-Muk; Chung, Jun-Yeon

14
SYSTEM FOR PRECISION MEASUREMENT OF STRUCTURE AND METHOD THEREFOR

Sohn, Hoon; Kim, Ki-Young; Koo, Gun-Hee; Choi, Jae-Muk; Chung, Jun-Yeon

15
SYSTEM FOR PRECISION MEASUREMENT OF STRUCTURE AND METHOD THEREFOR

Sohn, Hoon; Kim, Ki-Young; Koo, Gun-Hee; Choi, Jae-Muk; Chung, Jun-Yeon

16
SYSTEM FOR PRECISION MEASUREMENT OF STRUCTURE AND METHOD THEREFOR

Sohn, Hoon; Kim, Ki-Young; Koo, Gun-Hee; Choi, Jae-Muk; Chung, Jun-Yeon

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