DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Joung-Ho | ko |
dc.contributor.author | Lee, Eunjung | ko |
dc.contributor.author | Lee, Manho | ko |
dc.contributor.author | Kim, Jonghoon J. | ko |
dc.contributor.author | Kim, Mijoo | ko |
dc.contributor.author | Kim, Jonghoon | ko |
dc.contributor.author | Park,JK | ko |
dc.contributor.author | Bang, Yoonhee | ko |
dc.contributor.author | Il Kim | ko |
dc.date.accessioned | 2017-09-25T02:46:32Z | - |
dc.date.available | 2017-09-25T02:46:32Z | - |
dc.date.created | 2014-11-26 | - |
dc.date.created | 2014-11-26 | - |
dc.date.created | 2014-11-26 | - |
dc.date.issued | 2014-11-01 | - |
dc.identifier.citation | 23rd Conference on Electrical Performance of Electronic Packaging and Systems(EPEPS2014) | - |
dc.identifier.uri | http://hdl.handle.net/10203/225955 | - |
dc.language | English | - |
dc.publisher | 23rd Conference on Electrical Performance of Electronic Packaging and Systems(EPEPS2014) | - |
dc.title | High-speed Probe Card Design to Reduce the Crosstalk Noise for Wafer-level Test | - |
dc.type | Conference | - |
dc.identifier.wosid | 000380408900026 | - |
dc.identifier.scopusid | 2-s2.0-84988222684 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 23rd Conference on Electrical Performance of Electronic Packaging and Systems(EPEPS2014) | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Embassy Suites by Hilton Portland Downtown, Portland, OR | - |
dc.contributor.localauthor | Kim, Joung-Ho | - |
dc.contributor.nonIdAuthor | Lee, Eunjung | - |
dc.contributor.nonIdAuthor | Lee, Manho | - |
dc.contributor.nonIdAuthor | Kim, Jonghoon J. | - |
dc.contributor.nonIdAuthor | Kim, Mijoo | - |
dc.contributor.nonIdAuthor | Kim, Jonghoon | - |
dc.contributor.nonIdAuthor | Park,JK | - |
dc.contributor.nonIdAuthor | Bang, Yoonhee | - |
dc.contributor.nonIdAuthor | Il Kim | - |
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