A Study on Nano-sized Silica Content and Size Effect in Non Conductive Films (NCFs) for Ultra Fine-Pitch Cu-Pillar/Sn-Ag Micro-Bump Interconnection

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dc.contributor.authorLee, HanMinko
dc.contributor.authorLee, SeYongko
dc.contributor.authorCho, SeMinko
dc.contributor.authorPark, Jong-Hoko
dc.contributor.authorPaik, Kyung-Wookko
dc.date.accessioned2017-05-25T06:03:26Z-
dc.date.available2017-05-25T06:03:26Z-
dc.date.created2017-05-15-
dc.date.issued2017-05-31-
dc.identifier.citation2017 IEEE 67th Electronic Components and Technology Conference-
dc.identifier.urihttp://hdl.handle.net/10203/223721-
dc.languageEnglish-
dc.publisherIEEE-CPMT-
dc.titleA Study on Nano-sized Silica Content and Size Effect in Non Conductive Films (NCFs) for Ultra Fine-Pitch Cu-Pillar/Sn-Ag Micro-Bump Interconnection-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname2017 IEEE 67th Electronic Components and Technology Conference-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationWalt Disney Swan & Dolphin, Orlando, FL-
dc.contributor.localauthorPaik, Kyung-Wook-
dc.contributor.nonIdAuthorCho, SeMin-
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MS-Conference Papers(학술회의논문)
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