An Input Data and Power Noise Inducing Clock Jitter Tolerant Reference-Less Digital CDR for LCD Intra-Panel Interface

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dc.contributor.authorKim, Yonghunko
dc.contributor.authorLee, Taehoko
dc.contributor.authorJeon, Hyun-Kyuko
dc.contributor.authorLee, Dongilko
dc.contributor.authorKim, Lee-Supko
dc.date.accessioned2017-05-15T05:20:06Z-
dc.date.available2017-05-15T05:20:06Z-
dc.date.created2016-11-15-
dc.date.created2016-11-15-
dc.date.created2016-11-15-
dc.date.created2016-11-15-
dc.date.issued2017-04-
dc.identifier.citationIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.64, no.4, pp.823 - 835-
dc.identifier.issn1549-8328-
dc.identifier.urihttp://hdl.handle.net/10203/223703-
dc.description.abstractThis paper presents a reference-less digital clock and data recovery (CDR) for liquid crystal display (LCD) intrapanel interfaces. The increments of the display resolution, the color depth, and frame rate demand high speed transmission capacity between timing controller and source driver IC (SDIC). As the data rate increases, the performances of the CDR in the SDIC especially for the tolerance of input jitter and ground noise become important to recover the data without an error. This work exploits the half-bit previous input data with feed forward method and early/late signal from CDR to be tolerant to the input jitter and power noise. Two prototypes are tested with half-rate clocking at 5 Gb/s data rate, and quarter-late clocking at 10 Gb/s data rate. Both 5 Gb/s and 10 Gb/s prototypes improve the tolerance of the input jitter and power noise. Fabricated in 65 nm CMOS technology, the test chips consume 17.44 mW and 20.7 mW, respectively.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectDATA RECOVERY CIRCUIT-
dc.subjectPHASE-LOCKED LOOP-
dc.subjectSOI CMOS-
dc.titleAn Input Data and Power Noise Inducing Clock Jitter Tolerant Reference-Less Digital CDR for LCD Intra-Panel Interface-
dc.typeArticle-
dc.identifier.wosid000399015100007-
dc.identifier.scopusid2-s2.0-85010190088-
dc.type.rimsART-
dc.citation.volume64-
dc.citation.issue4-
dc.citation.beginningpage823-
dc.citation.endingpage835-
dc.citation.publicationnameIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS-
dc.identifier.doi10.1109/TCSI.2016.2630119-
dc.contributor.localauthorKim, Lee-Sup-
dc.contributor.nonIdAuthorJeon, Hyun-Kyu-
dc.contributor.nonIdAuthorLee, Dongil-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorClock and data recovery-
dc.subject.keywordAuthorclock jitter tolerance-
dc.subject.keywordAuthorinput jitter tolerance-
dc.subject.keywordAuthorLCD intra-panel interface-
dc.subject.keywordAuthorpower noise tolerance-
dc.subject.keywordPlusDATA RECOVERY CIRCUIT-
dc.subject.keywordPlusPHASE-LOCKED LOOP-
dc.subject.keywordPlusSOI CMOS-
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