Showing results 6 to 7 of 7
Measuring corporate failure risk: Does long short-term memory perform better in all markets? Kim, Hyeongjun; Cho, Hoon; Ryu, Doojin, INVESTMENT ANALYSTS JOURNAL, v.52, no.1, pp.40 - 52, 2023-03 |
Predicting corporate defaults using machine learning with geometric-lag variables Kim, Hyeongjun; Cho, Hoon; Ryu, Doojin, INVESTMENT ANALYSTS JOURNAL, v.50, no.3, pp.161 - 175, 2021-07 |
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