FEPMA: Fine-Grained Event-Driven Power Meter for Android Smartphones Based on Device Driver Layer Event Monitoring
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, KT | - |
| dc.contributor.author | Shin, DH | - |
| dc.contributor.author | Xie, Q | - |
| dc.contributor.author | Wang, Y | - |
| dc.contributor.author | Pedram, M | - |
| dc.contributor.author | Chang, Naehyuck | - |
| dc.date.accessioned | 2017-01-13T08:09:28Z | - |
| dc.date.available | 2017-01-13T08:09:28Z | - |
| dc.date.created | 2014-07-09 | - |
| dc.date.issued | 2014-03-24 | - |
| dc.identifier.citation | Design Automation and Test in Europe (DATE) | - |
| dc.identifier.uri | http://hdl.handle.net/10203/219199 | - |
| dc.language | English | - |
| dc.publisher | European Design and Automation Association (EDAA) | - |
| dc.title | FEPMA: Fine-Grained Event-Driven Power Meter for Android Smartphones Based on Device Driver Layer Event Monitoring | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | Design Automation and Test in Europe (DATE) | - |
| dc.identifier.conferencecountry | GE | - |
| dc.identifier.conferencelocation | Maritim Hotel Dresden | - |
| dc.contributor.localauthor | Chang, Naehyuck | - |
| dc.contributor.nonIdAuthor | Kim, KT | - |
| dc.contributor.nonIdAuthor | Shin, DH | - |
| dc.contributor.nonIdAuthor | Xie, Q | - |
| dc.contributor.nonIdAuthor | Wang, Y | - |
| dc.contributor.nonIdAuthor | Pedram, M | - |
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