DC Field | Value | Language |
---|---|---|
dc.contributor.author | Roh, Young Tak | ko |
dc.contributor.author | Lee, Hee Chul | ko |
dc.date.accessioned | 2017-01-13T07:11:34Z | - |
dc.date.available | 2017-01-13T07:11:34Z | - |
dc.date.created | 2016-12-26 | - |
dc.date.created | 2016-12-26 | - |
dc.date.created | 2016-12-26 | - |
dc.date.issued | 2015-11-02 | - |
dc.identifier.citation | 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015 | - |
dc.identifier.uri | http://hdl.handle.net/10203/218935 | - |
dc.description.abstract | A new n-MOSFET layout on a bulk silicon substrate proposed for TID and SEE radiation tolerance combing a DGA n-MOSFET and a guard drain. The proposed n-MOSFET layout consists of a p+ and a p-active layer on the source-to-drain sidewall to prevent the development of a leakage path between the source and the drain, a dummy gate on the side drain/source to avoid the development of a leakage path between two MOSFETs, and a guard drain on the side dummy gate to reduce the SEE effect. The proposed n-MOSFET layout was found to eliminate all radiation-induced leakage current paths and to reduce SEE pulse to 35.36% in comparison with the conventional n-MOSFET. The simulation results demonstrated that the proposed n-MOSFET structure on the bulk silicon substrate performs well even when the fixed charge density increases and energetic protons are injected. These results confirm that the proposed n-MOSFET on the bulk silicon substrate is radiation-tolerant. | - |
dc.language | English | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.title | TID and SEE hardened n-MOSFET layout on a bulk silicon substrate which combines a DGA n-MOSFET and a guard drain | - |
dc.type | Conference | - |
dc.identifier.wosid | 000413680600090 | - |
dc.identifier.scopusid | 2-s2.0-84994159082 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015 | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Town & Country Resort Hotel & Convention Center, SanDiego | - |
dc.identifier.doi | 10.1109/NSSMIC.2015.7581808 | - |
dc.contributor.localauthor | Lee, Hee Chul | - |
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