Scanning flow-impedance microscopy: A simple imaging technique based on hydrodynamics

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dc.contributor.authorKim, Tae Youngko
dc.contributor.authorKim, DKko
dc.contributor.authorKim, SungJinko
dc.contributor.authorKim, DKko
dc.date.accessioned2011-01-24T07:43:53Z-
dc.date.available2011-01-24T07:43:53Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2009-10-
dc.identifier.citationREVIEW OF SCIENTIFIC INSTRUMENTS, v.80, no.10-
dc.identifier.issn0034-6748-
dc.identifier.urihttp://hdl.handle.net/10203/21783-
dc.description.abstractWe introduce the concept of scanning flow-impedance microscopy (SFIM) which is an imaging technique based on hydrodynamics. Using a simple experimental setup including a mass flow controller and a manometer, the operating principle of SFIM is validated under atmospheric pressure and temperature conditions. Experimental results show that the flow impedance strongly depends on the relative distance between a probe and a specimen. SFIM micrographs of microscale patterns with various linewidths are presented. (C) 2009 American Institute of Physics. [doi:10.1063/1.3238483]-
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherAMER INST PHYSICS, CIRCULATION & FULFILLMENT DIV-
dc.subjectATOMIC-FORCE MICROSCOPY-
dc.subjectSELF-ASSEMBLED MONOLAYERS-
dc.subjectTUNNELING MICROSCOPY-
dc.subjectELECTRON-MICROSCOPY-
dc.subjectJET-
dc.subjectSURFACE-
dc.subjectLIQUID-
dc.titleScanning flow-impedance microscopy: A simple imaging technique based on hydrodynamics-
dc.typeArticle-
dc.identifier.wosid000271359300019-
dc.identifier.scopusid2-s2.0-70350761966-
dc.type.rimsART-
dc.citation.volume80-
dc.citation.issue10-
dc.citation.publicationnameREVIEW OF SCIENTIFIC INSTRUMENTS-
dc.identifier.doi10.1063/1.3238483-
dc.contributor.localauthorKim, SungJin-
dc.contributor.nonIdAuthorKim, DK-
dc.contributor.nonIdAuthorKim, DK-
dc.type.journalArticleArticle-
dc.subject.keywordPlusATOMIC-FORCE MICROSCOPY-
dc.subject.keywordPlusSELF-ASSEMBLED MONOLAYERS-
dc.subject.keywordPlusTUNNELING-MICROSCOPY-
dc.subject.keywordPlusELECTRON-MICROSCOPY-
dc.subject.keywordPlusJET-
dc.subject.keywordPlusSURFACE-
dc.subject.keywordPlusLIQUID-
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