DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Tae Young | ko |
dc.contributor.author | Kim, DK | ko |
dc.contributor.author | Kim, SungJin | ko |
dc.contributor.author | Kim, DK | ko |
dc.date.accessioned | 2011-01-24T07:43:53Z | - |
dc.date.available | 2011-01-24T07:43:53Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2009-10 | - |
dc.identifier.citation | REVIEW OF SCIENTIFIC INSTRUMENTS, v.80, no.10 | - |
dc.identifier.issn | 0034-6748 | - |
dc.identifier.uri | http://hdl.handle.net/10203/21783 | - |
dc.description.abstract | We introduce the concept of scanning flow-impedance microscopy (SFIM) which is an imaging technique based on hydrodynamics. Using a simple experimental setup including a mass flow controller and a manometer, the operating principle of SFIM is validated under atmospheric pressure and temperature conditions. Experimental results show that the flow impedance strongly depends on the relative distance between a probe and a specimen. SFIM micrographs of microscale patterns with various linewidths are presented. (C) 2009 American Institute of Physics. [doi:10.1063/1.3238483] | - |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | AMER INST PHYSICS, CIRCULATION & FULFILLMENT DIV | - |
dc.subject | ATOMIC-FORCE MICROSCOPY | - |
dc.subject | SELF-ASSEMBLED MONOLAYERS | - |
dc.subject | TUNNELING MICROSCOPY | - |
dc.subject | ELECTRON-MICROSCOPY | - |
dc.subject | JET | - |
dc.subject | SURFACE | - |
dc.subject | LIQUID | - |
dc.title | Scanning flow-impedance microscopy: A simple imaging technique based on hydrodynamics | - |
dc.type | Article | - |
dc.identifier.wosid | 000271359300019 | - |
dc.identifier.scopusid | 2-s2.0-70350761966 | - |
dc.type.rims | ART | - |
dc.citation.volume | 80 | - |
dc.citation.issue | 10 | - |
dc.citation.publicationname | REVIEW OF SCIENTIFIC INSTRUMENTS | - |
dc.identifier.doi | 10.1063/1.3238483 | - |
dc.contributor.localauthor | Kim, SungJin | - |
dc.contributor.nonIdAuthor | Kim, DK | - |
dc.contributor.nonIdAuthor | Kim, DK | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | ATOMIC-FORCE MICROSCOPY | - |
dc.subject.keywordPlus | SELF-ASSEMBLED MONOLAYERS | - |
dc.subject.keywordPlus | TUNNELING-MICROSCOPY | - |
dc.subject.keywordPlus | ELECTRON-MICROSCOPY | - |
dc.subject.keywordPlus | JET | - |
dc.subject.keywordPlus | SURFACE | - |
dc.subject.keywordPlus | LIQUID | - |
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