Computer aided design and optimization of integrated circuits with RF MEMS devices by an ANN based macro-modeling approach

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Artificial neural network (ANN) based macro-modeling approach for design and optimization of integrated circuits (ICs) with radio frequency microelectromechanical systems (RF MEMS) is presented. The finite element method (FEM) analysis is utilized for both characterization of the device and generation of training and testing data for the ANN model. Developed ANN based approach has shown excellent agreement with the FEM model and measurements. The integration of the ANN model in an RF circuit simulator shows that the proposed methodology is suitable for a circuit-level analysis, design, and optimization of MEMS devices.
Publisher
NSTI-Nanotech 2005
Issue Date
2005-05
Language
English
Citation

2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005, pp.565 - 568

URI
http://hdl.handle.net/10203/216690
Appears in Collection
ME-Conference Papers(학술회의논문)
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