ELECTROTHERMAL MEMS FIBER SCANNER WITH LISSAJOUS PATTERNS FOR ENDOMICROSCOPIC APPLICATIONS
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Seo, Yeong Hyeon | ko |
| dc.contributor.author | Park, Hyeon Cheol | ko |
| dc.contributor.author | Jeong, Ki Hun | ko |
| dc.date.accessioned | 2017-01-10T02:27:07Z | - |
| dc.date.available | 2017-01-10T02:27:07Z | - |
| dc.date.created | 2016-12-16 | - |
| dc.date.created | 2016-12-16 | - |
| dc.date.created | 2016-12-16 | - |
| dc.date.created | 2016-12-16 | - |
| dc.date.issued | 2016-01-25 | - |
| dc.identifier.citation | IEEE MEMS 2016 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/216445 | - |
| dc.language | English | - |
| dc.publisher | MEMS association | - |
| dc.title | ELECTROTHERMAL MEMS FIBER SCANNER WITH LISSAJOUS PATTERNS FOR ENDOMICROSCOPIC APPLICATIONS | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000381797300097 | - |
| dc.identifier.scopusid | 2-s2.0-84970976554 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | IEEE MEMS 2016 | - |
| dc.identifier.conferencecountry | CC | - |
| dc.identifier.conferencelocation | Shanghai, China | - |
| dc.contributor.localauthor | Jeong, Ki Hun | - |
| dc.contributor.nonIdAuthor | Park, Hyeon Cheol | - |
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