A Selective Upscaling Method via Super-Resolution Validity Measure
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Choi, Seok-Eon | ko |
| dc.contributor.author | Kim, Jonghee | ko |
| dc.contributor.author | Kim, Chang-Ick | ko |
| dc.date.accessioned | 2017-01-03T08:23:28Z | - |
| dc.date.available | 2017-01-03T08:23:28Z | - |
| dc.date.created | 2016-11-15 | - |
| dc.date.created | 2016-11-15 | - |
| dc.date.issued | 2016-10-27 | - |
| dc.identifier.citation | IEEE International Conference on Consumer Electronics (ICCE) | - |
| dc.identifier.uri | http://hdl.handle.net/10203/215804 | - |
| dc.language | English | - |
| dc.publisher | IEEE | - |
| dc.title | A Selective Upscaling Method via Super-Resolution Validity Measure | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000392398600064 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | IEEE International Conference on Consumer Electronics (ICCE) | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | COEX Convention Center, Seoul | - |
| dc.contributor.localauthor | Kim, Chang-Ick | - |
| dc.contributor.nonIdAuthor | Choi, Seok-Eon | - |
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