DC Field | Value | Language |
---|---|---|
dc.contributor.author | Shin, Mincheol | ko |
dc.contributor.author | Jeong, Woo Jin | ko |
dc.contributor.author | Seo, Junbeom | ko |
dc.date.accessioned | 2017-01-03T07:40:25Z | - |
dc.date.available | 2017-01-03T07:40:25Z | - |
dc.date.created | 2016-11-17 | - |
dc.date.created | 2016-11-17 | - |
dc.date.created | 2016-11-17 | - |
dc.date.issued | 2016-09-07 | - |
dc.identifier.citation | International Conference on Simulation of Semiconductor Processes and Devices 2016 | - |
dc.identifier.uri | http://hdl.handle.net/10203/215658 | - |
dc.language | English | - |
dc.publisher | SISPAD | - |
dc.title | First Principles Based NEGF Simulations of Si Nanowire FETs | - |
dc.type | Conference | - |
dc.identifier.wosid | 000386893600052 | - |
dc.identifier.scopusid | 2-s2.0-85015615333 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | International Conference on Simulation of Semiconductor Processes and Devices 2016 | - |
dc.identifier.conferencecountry | GE | - |
dc.identifier.conferencelocation | Le Meridien Grand Hotel, Nuremberg | - |
dc.contributor.localauthor | Shin, Mincheol | - |
dc.contributor.nonIdAuthor | Jeong, Woo Jin | - |
dc.contributor.nonIdAuthor | Seo, Junbeom | - |
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