Eye-diagram estimation using equivalent circuit model of coupled microstrip channel on high-speed and wide I/O Channel for 2.5D and 3D IC

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dc.contributor.authorChoi, Suminko
dc.contributor.authorKim, Jounghoko
dc.contributor.authorKim, Hee-Gonko
dc.contributor.authorJung, Daniel Hyunsukko
dc.contributor.authorKim, Jonghoon J.ko
dc.contributor.authorLim, Jaeminko
dc.contributor.authorLee, Hyunsukko
dc.contributor.authorCho, Kyungjunko
dc.date.accessioned2017-01-03T07:22:28Z-
dc.date.available2017-01-03T07:22:28Z-
dc.date.created2016-11-21-
dc.date.created2016-11-21-
dc.date.created2016-11-21-
dc.date.issued2016-05-08-
dc.identifier.citation20th IEEE Workshop on Signal and Power Integrity, SPI 2016-
dc.identifier.issn2475-9481-
dc.identifier.urihttp://hdl.handle.net/10203/215577-
dc.description.abstractIn this paper, eye-diagrams of coupled microstrip channel on Printed Circuit Board (PCB) are estimated using equivalent circuit model. The equivalent circuit model has RLGC terms which are calculated from the physical dimensions of the coupled microstrip channel. Since the coupled microstrip channel is modeled by physical dimensions, eye-diagrams are estimated without 3D Full EM simulation, which needs long simulation time to extract channel performance. In addition, the equivalent circuit model enhances physical insight of the coupled channel and crosstalk effects. To verify the equivalent circuit model, frequency and time domain simulations are performed. As a result, worst eye-diagrams are estimated and compared with the 3D Full EM simulation.-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleEye-diagram estimation using equivalent circuit model of coupled microstrip channel on high-speed and wide I/O Channel for 2.5D and 3D IC-
dc.typeConference-
dc.identifier.wosid000382851000003-
dc.identifier.scopusid2-s2.0-84980396134-
dc.type.rimsCONF-
dc.citation.publicationname20th IEEE Workshop on Signal and Power Integrity, SPI 2016-
dc.identifier.conferencecountryIT-
dc.identifier.conferencelocationTurin-
dc.identifier.doi10.1109/SaPIW.2016.7496257-
dc.contributor.localauthorKim, Joungho-
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EE-Conference Papers(학술회의논문)
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