DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yang, Jinyeol | ko |
dc.contributor.author | Choi, Jaemook | ko |
dc.contributor.author | Hwang, Soonkyu | ko |
dc.contributor.author | An, Yun-Kyu | ko |
dc.contributor.author | Sohn, Hoon | ko |
dc.date.accessioned | 2016-09-07T01:42:06Z | - |
dc.date.available | 2016-09-07T01:42:06Z | - |
dc.date.created | 2016-08-16 | - |
dc.date.created | 2016-08-16 | - |
dc.date.created | 2016-08-16 | - |
dc.date.issued | 2016-07 | - |
dc.identifier.citation | MEASUREMENT SCIENCE AND TECHNOLOGY, v.27, no.8 | - |
dc.identifier.issn | 0957-0233 | - |
dc.identifier.uri | http://hdl.handle.net/10203/212550 | - |
dc.description.abstract | As quality control of micro devices and early detection of micro defects in these devices are becoming increasingly important, the demand for a fast and automated online inspection technique to detect micro defects with high spatial resolution is increasing. In this study, a reference-free micro defect visualization algorithm is developed based on laser scanning thermography to detect micro defects in devices instantaneously and automatically with high spatial resolution. A pulse modulated continuous wave laser generates thermal waves in a target device, and the corresponding thermal responses are recorded by an infrared (IR) camera. When the thermal wave encounters a micro defect, the propagation of the thermal wave is blocked at the interface of the micro defect. The blockage of the thermal wave is detected by the proposed reference-free micro defect visualization algorithm. First, an edge detection algorithm is applied to a raw thermal image obtained at a specific time point to extract the thermal discontinuities formed at the boundaries of the defect. The edge images obtained from all time sequences are then assembled into a single accumulated edge image to accentuate defect-induced thermal disturbances in the form of edge features. Finally, the accumulated edge image is automatically processed using a binary imaging algorithm to visualize the micro defect in the target device. The performance of the proposed reference-free micro defect visualization algorithm is examined using two types of specimens, semiconductor chips and ceramic-epoxy composites. The proposed algorithm successfully diagnoses micro defects ranging from 4 mu m to 40 mu m in width | - |
dc.language | English | - |
dc.publisher | IOP PUBLISHING LTD | - |
dc.title | A reference-free micro defect visualization using pulse laser scanning thermography and image processing | - |
dc.type | Article | - |
dc.identifier.wosid | 000380124800034 | - |
dc.identifier.scopusid | 2-s2.0-84978952309 | - |
dc.type.rims | ART | - |
dc.citation.volume | 27 | - |
dc.citation.issue | 8 | - |
dc.citation.publicationname | MEASUREMENT SCIENCE AND TECHNOLOGY | - |
dc.identifier.doi | 10.1088/0957-0233/27/8/085601 | - |
dc.contributor.localauthor | Sohn, Hoon | - |
dc.contributor.nonIdAuthor | Yang, Jinyeol | - |
dc.contributor.nonIdAuthor | Choi, Jaemook | - |
dc.contributor.nonIdAuthor | Hwang, Soonkyu | - |
dc.contributor.nonIdAuthor | An, Yun-Kyu | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | pulsed thermography | - |
dc.subject.keywordAuthor | laser scanning | - |
dc.subject.keywordAuthor | micro defect visualization | - |
dc.subject.keywordAuthor | image processing | - |
dc.subject.keywordAuthor | reference-free | - |
dc.subject.keywordAuthor | non-destructive testing | - |
dc.subject.keywordPlus | LOCK-IN THERMOGRAPHY | - |
dc.subject.keywordPlus | MODULATED THERMOGRAPHY | - |
dc.subject.keywordPlus | ENHANCEMENT | - |
dc.subject.keywordPlus | TOOL | - |
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