Seebeck effect at the Atomic Scale: Principle of Scanning Seebeck Microscopy
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 이의섭 | ko |
| dc.contributor.author | 조상희 | ko |
| dc.contributor.author | 여호기 | ko |
| dc.contributor.author | 김용현 | ko |
| dc.date.accessioned | 2016-07-13T04:46:04Z | - |
| dc.date.available | 2016-07-13T04:46:04Z | - |
| dc.date.created | 2015-12-30 | - |
| dc.date.issued | 2014-07-08 | - |
| dc.identifier.citation | International Conference on Thermoelectric (ICT 2014) | - |
| dc.identifier.uri | http://hdl.handle.net/10203/211397 | - |
| dc.language | English | - |
| dc.publisher | International Thermoelectrics Society | - |
| dc.title | Seebeck effect at the Atomic Scale: Principle of Scanning Seebeck Microscopy | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | International Conference on Thermoelectric (ICT 2014) | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Renaissance Nashville Hotel | - |
| dc.contributor.localauthor | 김용현 | - |
| dc.contributor.nonIdAuthor | 조상희 | - |
| dc.contributor.nonIdAuthor | 여호기 | - |
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