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College of Natural Sciences(자연과학대학)Dept. of Physics(물리학과)PH-Conference Papers(학술회의논문)

The effect of Al impurities on the effective work function at metal/HfO2 interfaces

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Kim, Geun Myeong / Oh, Young Jun / Chang, Kee Jooresearcher
Publisher
ICDS
Issue Date
2015-07
Language
English
Citation

2015 28th International Conference on Defects in Semiconductors

URI
http://hdl.handle.net/10203/210801
Appears in Collection
PH-Conference Papers(학술회의논문)
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