(Poster) Sensitivity of Si waveguide mode index to nanometer scale fabrication inhomogeneity
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Nayoung | ko |
| dc.contributor.author | Shin, Jonghwa | ko |
| dc.date.accessioned | 2016-07-07T05:13:07Z | - |
| dc.date.available | 2016-07-07T05:13:07Z | - |
| dc.date.created | 2016-06-22 | - |
| dc.date.issued | 2015-11-13 | - |
| dc.identifier.citation | NANOPIA 2015 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/209798 | - |
| dc.language | English | - |
| dc.publisher | 경남신문, 부산대학교나노기술대학 | - |
| dc.title | (Poster) Sensitivity of Si waveguide mode index to nanometer scale fabrication inhomogeneity | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | NANOPIA 2015 | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | 창원컨벤션센터 컨벤션홀 | - |
| dc.contributor.localauthor | Shin, Jonghwa | - |
| dc.contributor.nonIdAuthor | Kim, Nayoung | - |
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