Bayesian inference for edge electron density profiles from the JET Li-BES data

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dc.contributor.authorKwak, Sehyun-
dc.contributor.authorSvensson, J-
dc.contributor.authorBrix, M-
dc.contributor.authorGhim, Young chul-
dc.contributor.authorContributors, JET-
dc.date.accessioned2016-07-06T04:43:49Z-
dc.date.available2016-07-06T04:43:49Z-
dc.date.created2016-05-30-
dc.date.issued2016-02-29-
dc.identifier.citationDeutsche Physikalische Gesellschaft Spring Meeting-
dc.identifier.urihttp://hdl.handle.net/10203/209659-
dc.languageEnglish-
dc.publisherDeutsche Physikalische Gesellschaft-
dc.titleBayesian inference for edge electron density profiles from the JET Li-BES data-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameDeutsche Physikalische Gesellschaft Spring Meeting-
dc.identifier.conferencecountryGE-
dc.identifier.conferencelocationHanover-
dc.contributor.localauthorKwak, Sehyun-
dc.contributor.localauthorGhim, Young chul-
dc.contributor.nonIdAuthorSvensson, J-
dc.contributor.nonIdAuthorBrix, M-
dc.contributor.nonIdAuthorContributors, JET-
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NE-Conference Papers(학술회의논문)
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