Quantifying noise sources in the KSTAR 2014 Thomson Scattering system from the measured variation on electron temperature

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dc.contributor.authorOh, TSko
dc.contributor.authorKim, Kko
dc.contributor.authorLee, JHko
dc.contributor.authorLee, SHko
dc.contributor.authorScannell, Rko
dc.contributor.authorField, ARko
dc.contributor.authorCho, Kko
dc.contributor.authorBawaaneh, MSko
dc.contributor.authorGhim, Young-chulko
dc.date.accessioned2016-07-05T08:22:24Z-
dc.date.available2016-07-05T08:22:24Z-
dc.date.created2016-05-30-
dc.date.created2016-05-30-
dc.date.issued2016-03-
dc.identifier.citationJOURNAL OF INSTRUMENTATION, v.11-
dc.identifier.issn1748-0221-
dc.identifier.urihttp://hdl.handle.net/10203/209360-
dc.description.abstractWith the Thomson scattering (TS) system in KSTAR, temporal evolution of electron temperature (T-e) is estimated using a weighted look-up table method with fast sampling (1 : 25 or 2.5GS/s) digitizers during the 2014 KSTAR campaign. Background noise level is used as a weighting parameter without considering the photon noise due to the absence of information on absolute photon counts detected by the TS system. Estimated electron temperature during a relatively quiescent discharge are scattered, i.e., 15% variation on T-e with respect to its mean value. We find that this 15% variation on T-e cannot be explained solely by the background noise level which leads us to include photon noise effects in our analysis. Using synthetic data, we have estimated the required photon noise level consistent with the observation and determined the dominant noise source in KSTAR TS system.-
dc.languageEnglish-
dc.publisherIOP PUBLISHING LTD-
dc.titleQuantifying noise sources in the KSTAR 2014 Thomson Scattering system from the measured variation on electron temperature-
dc.typeArticle-
dc.identifier.wosid000375746200037-
dc.identifier.scopusid2-s2.0-84962018344-
dc.type.rimsART-
dc.citation.volume11-
dc.citation.publicationnameJOURNAL OF INSTRUMENTATION-
dc.identifier.doi10.1088/1748-0221/11/03/C03036-
dc.contributor.localauthorGhim, Young-chul-
dc.contributor.nonIdAuthorOh, TS-
dc.contributor.nonIdAuthorKim, K-
dc.contributor.nonIdAuthorLee, JH-
dc.contributor.nonIdAuthorLee, SH-
dc.contributor.nonIdAuthorScannell, R-
dc.contributor.nonIdAuthorField, AR-
dc.contributor.nonIdAuthorCho, K-
dc.contributor.nonIdAuthorBawaaneh, MS-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle; Proceedings Paper-
dc.subject.keywordAuthorPlasma diagnostics - interferometry, spectroscopy and imaging-
dc.subject.keywordAuthorAnalysis and statistical methods-
dc.subject.keywordAuthorData processing methods-
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