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Sensing current and forces with SPM

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dc.contributor.authorPark, JeongYoungko
dc.contributor.authorMaier, Sko
dc.contributor.authorHendriksen, Bko
dc.contributor.authorSalmeron, Mko
dc.date.accessioned2010-12-09T09:05:21Z-
dc.date.available2010-12-09T09:05:21Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2010-10-
dc.identifier.citationMATERIALS TODAY, v.13, no.10, pp.37 - 44-
dc.identifier.issn1369-7021-
dc.identifier.urihttp://hdl.handle.net/10203/20899-
dc.description.abstractAtomic force microscopy (AFM) and scanning tunneling microscopy (STM) are well established techniques to image surfaces and to probe material properties at the atomic and molecular scale. In this review, we show hybrid combinations of AFM and STM that bring together the best of two worlds: the simultaneous detection of atomic scale forces and conduction properties. We illustrate with several examples how the detection of forces in STM and the detection of currents in AFM can give valuable additional information of the nanoscale material properties.-
dc.description.sponsorshipThis work was supported by the Director, Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. J.Y.P. acknowledges the partial support by WCU (World Class University) program through the National Research Foundation of Korea funded by the Ministry of Education, Science and Technology (31-2008-000-10055-0).en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherELSEVIER SCI LTD-
dc.subjectSELF-ASSEMBLED MONOLAYERS-
dc.subjectSCANNING-TUNNELING-MICROSCOPY-
dc.subjectMOLECULE-METAL JUNCTIONS-
dc.subjectCARBON NANOTUBES-
dc.subjectELECTRICAL-PROPERTIES-
dc.subjectATOMIC-RESOLUTION-
dc.subjectDISTANCE DEPENDENCE-
dc.subjectCHARGE-TRANSPORT-
dc.subjectCONDUCTIVE AFM-
dc.subjectPROBE-
dc.titleSensing current and forces with SPM-
dc.typeArticle-
dc.identifier.wosid000283049400018-
dc.identifier.scopusid2-s2.0-77958043131-
dc.type.rimsART-
dc.citation.volume13-
dc.citation.issue10-
dc.citation.beginningpage37-
dc.citation.endingpage44-
dc.citation.publicationnameMATERIALS TODAY-
dc.contributor.localauthorPark, JeongYoung-
dc.contributor.nonIdAuthorMaier, S-
dc.contributor.nonIdAuthorHendriksen, B-
dc.contributor.nonIdAuthorSalmeron, M-
dc.type.journalArticleArticle-
dc.subject.keywordPlusSELF-ASSEMBLED MONOLAYERS-
dc.subject.keywordPlusSCANNING-TUNNELING-MICROSCOPY-
dc.subject.keywordPlusMOLECULE-METAL JUNCTIONS-
dc.subject.keywordPlusCARBON NANOTUBES-
dc.subject.keywordPlusELECTRICAL-PROPERTIES-
dc.subject.keywordPlusATOMIC-RESOLUTION-
dc.subject.keywordPlusDISTANCE DEPENDENCE-
dc.subject.keywordPlusCHARGE-TRANSPORT-
dc.subject.keywordPlusCONDUCTIVE AFM-
dc.subject.keywordPlusPROBE-
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