DC Field | Value | Language |
---|---|---|
dc.contributor.author | 임태우 | ko |
dc.contributor.author | 양동열 | ko |
dc.date.accessioned | 2016-07-04T02:03:31Z | - |
dc.date.available | 2016-07-04T02:03:31Z | - |
dc.date.created | 2016-04-22 | - |
dc.date.created | 2016-04-22 | - |
dc.date.created | 2016-04-22 | - |
dc.date.issued | 2015-10 | - |
dc.identifier.citation | 한국정밀공학회지, v.32, no.10, pp.911 - 916 | - |
dc.identifier.issn | 1225-9071 | - |
dc.identifier.uri | http://hdl.handle.net/10203/208856 | - |
dc.description.abstract | In the nano/micro scale, material properties are dependent on the size-scale of a structure. However, conventional micro-scale tensile tests have limitations to obtain reliable values of nano-scale material properties owing to residual stress and elastic slippage in the gripping/aligning process. The indenter-driven nano-scale tensile test provides prominent advantages simple testing device, high-quality nano-scale metallic specimen with negligible residual stress. In this paper, two-types of specimens (a specimen with multi-testing parts and a specimen with a single-testing part) are discussed. Focused ion beam (FIB) is employed to fabricate a nano-scale specimen from a thin nickel film. Using the specimen with a single-testing part, we obtained a nano-scale stress-strain curve of electroplated nickel film. | - |
dc.language | Korean | - |
dc.publisher | 한국정밀공학회 | - |
dc.title | 나노 인장시험을 위한 압축 시험기용 인장시편 제작에 관한 연구 | - |
dc.title.alternative | Fabrication of Nano-Size Specimens for Tensile Test Employing Nano-Indentation Device | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.citation.volume | 32 | - |
dc.citation.issue | 10 | - |
dc.citation.beginningpage | 911 | - |
dc.citation.endingpage | 916 | - |
dc.citation.publicationname | 한국정밀공학회지 | - |
dc.identifier.doi | 10.7736/KSPE.2015.32.10.911 | - |
dc.identifier.kciid | ART002034986 | - |
dc.contributor.localauthor | 양동열 | - |
dc.description.isOpenAccess | N | - |
dc.subject.keywordAuthor | Nano-scale tensile test (나노인장시험) | - |
dc.subject.keywordAuthor | Focused ion beam (집속 이온빔) | - |
dc.subject.keywordAuthor | Thin film (박막) | - |
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