Measurement of Thermal Conductivities of SiN and TbFeCo Fiims
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Seong-Sue | - |
| dc.contributor.author | Ahn, Young-Man | - |
| dc.contributor.author | Lee, Kymg-Gem | - |
| dc.contributor.author | Gll, Byeang-Lyong | - |
| dc.contributor.author | Shin, Sung-Chul | - |
| dc.date.accessioned | 2010-12-06T07:33:54Z | - |
| dc.date.available | 2010-12-06T07:33:54Z | - |
| dc.date.issued | 1996-09 | - |
| dc.identifier.citation | IEEE Transactions on Magnetics, Vol.32, No.5 | en |
| dc.identifier.issn | 00I8-9464 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/20767 | - |
| dc.description.abstract | The effective them1 conductivities of SiN and TbFeCo thin films were masulltd by conparing the length and width of polarizing mcroscope inage of them-nagnetically written dormins with those of calculated isothem for the hilayer structum of subsh'atdSi3N4/Tb22F ~oC08/SiN3 4. The multing data we= applied to the quadrillayer shuchrre of substratel Si3N4/Tb22Fe70Cos/Si3N4/Ala,n d the length of calculated isotherm was tumed out to agree with that of written dounin. | en |
| dc.language.iso | en_US | en |
| dc.publisher | IEEE | en |
| dc.title | Measurement of Thermal Conductivities of SiN and TbFeCo Fiims | en |
| dc.type | Article | en |
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