X-ray Inspection System with Two Flat Panel Detectors for Extra-large Object Inspection

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dc.contributor.authorPark, Miranko
dc.contributor.authorCho, Seungryongko
dc.date.accessioned2016-05-16T04:18:45Z-
dc.date.available2016-05-16T04:18:45Z-
dc.date.created2016-01-05-
dc.date.issued2015-11-03-
dc.identifier.citation2015 IEEE Nuclear Science Symposium and Medical Imaging Conference-
dc.identifier.urihttp://hdl.handle.net/10203/207354-
dc.languageEnglish-
dc.publisherIEEE NSS/MIC-
dc.titleX-ray Inspection System with Two Flat Panel Detectors for Extra-large Object Inspection-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname2015 IEEE Nuclear Science Symposium and Medical Imaging Conference-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationTown & Country Resort Hotel & Convention Center, SanDiego-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorCho, Seungryong-
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NE-Conference Papers(학술회의논문)
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