(초청발표) Analysis of the grain boundary conductivity of doped CeO2 thin films at elevated temperature
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kwak, No Woo | - |
| dc.contributor.author | Jung, Woo Chul | - |
| dc.date.accessioned | 2016-04-20T05:19:52Z | - |
| dc.date.available | 2016-04-20T05:19:52Z | - |
| dc.date.created | 2015-12-14 | - |
| dc.date.issued | 2015-11-17 | - |
| dc.identifier.citation | The 3rd International Conference on Advanced Electromaterials (ICAE 2015), v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/204871 | - |
| dc.language | ENG | - |
| dc.publisher | Korean Institute of Electrical and Electronic Material Engineers (KIEEME) | - |
| dc.title | (초청발표) Analysis of the grain boundary conductivity of doped CeO2 thin films at elevated temperature | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | The 3rd International Conference on Advanced Electromaterials (ICAE 2015) | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Kwak, No Woo | - |
| dc.contributor.localauthor | Jung, Woo Chul | - |
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