Comparision on the Temperature Dependence of Performances of NCFETs and Conventional MOSFETs

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dc.contributor.authorSeo, Jun Beomko
dc.contributor.authorLee, Jae Hyuko
dc.contributor.authorShin, Min Cheolko
dc.date.accessioned2016-04-18T05:11:47Z-
dc.date.available2016-04-18T05:11:47Z-
dc.date.created2015-11-24-
dc.date.issued2015-06-29-
dc.identifier.citation2015 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD)-
dc.identifier.urihttp://hdl.handle.net/10203/204463-
dc.languageEnglish-
dc.publisherIEICE, IEIE-
dc.titleComparision on the Temperature Dependence of Performances of NCFETs and Conventional MOSFETs-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname2015 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD)-
dc.identifier.conferencecountryKO-
dc.identifier.conferencelocationJeju KAL Hotel, Jeju Island-
dc.contributor.localauthorShin, Min Cheol-
dc.contributor.nonIdAuthorSeo, Jun Beom-
dc.contributor.nonIdAuthorLee, Jae Hyu-
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EE-Conference Papers(학술회의논문)
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