DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jo, Young Min | - |
dc.contributor.author | Lee, Hee Chul | - |
dc.contributor.author | Sivananthan, Sivalingam | - |
dc.date.accessioned | 2016-04-18T04:57:40Z | - |
dc.date.available | 2016-04-18T04:57:40Z | - |
dc.date.created | 2015-11-24 | - |
dc.date.issued | 2015-10-08 | - |
dc.identifier.citation | The U.S. Workshop on the physics and chemistry of II-VI materials, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/204311 | - |
dc.language | ENG | - |
dc.publisher | EPIR Technologies | - |
dc.title | ROIC with Self-Calibration skimming for SWIR MCT arrays on Si substrates | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | The U.S. Workshop on the physics and chemistry of II-VI materials | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Lee, Hee Chul | - |
dc.contributor.nonIdAuthor | Jo, Young Min | - |
dc.contributor.nonIdAuthor | Sivananthan, Sivalingam | - |
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