DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Jong Hoon | ko |
dc.contributor.author | Song, Jin Wook | ko |
dc.contributor.author | Lee, Eun Jung | ko |
dc.contributor.author | Lee, Man Ho | ko |
dc.contributor.author | Park, Jung Keun | ko |
dc.contributor.author | Lee, Ji Sun | ko |
dc.contributor.author | Kim, Hyun Min | ko |
dc.contributor.author | Kim, Young Bu | ko |
dc.contributor.author | Nam, Seung Ki | ko |
dc.contributor.author | Kim, Joung Ho | ko |
dc.date.accessioned | 2016-04-18T04:43:41Z | - |
dc.date.available | 2016-04-18T04:43:41Z | - |
dc.date.created | 2015-11-23 | - |
dc.date.issued | 2015-11-23 | - |
dc.identifier.citation | 8th 2015 Korea-Japan Joint Conference on EMT/EMC/BE (KJJC) | - |
dc.identifier.uri | http://hdl.handle.net/10203/204160 | - |
dc.language | English | - |
dc.publisher | 8th 2015 Korea-Japan Joint Conference on EMT/EMC/BE (KJJC) | - |
dc.title | Signal Integrity Design of High-speed Semiconductor Test Probe Card | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 8th 2015 Korea-Japan Joint Conference on EMT/EMC/BE (KJJC) | - |
dc.identifier.conferencecountry | JA | - |
dc.identifier.conferencelocation | Sendai International Center | - |
dc.contributor.localauthor | Kim, Joung Ho | - |
dc.contributor.nonIdAuthor | Park, Jung Keun | - |
dc.contributor.nonIdAuthor | Lee, Ji Sun | - |
dc.contributor.nonIdAuthor | Kim, Hyun Min | - |
dc.contributor.nonIdAuthor | Kim, Young Bu | - |
dc.contributor.nonIdAuthor | Nam, Seung Ki | - |
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