Noise coupling emulation between TSV and active circuit through metal oxide patch
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Joungho | ko |
| dc.contributor.author | Jonghyun Cho | ko |
| dc.contributor.author | Jaemin Lim | ko |
| dc.date.accessioned | 2016-04-12T08:03:17Z | - |
| dc.date.available | 2016-04-12T08:03:17Z | - |
| dc.date.created | 2015-10-12 | - |
| dc.date.created | 2015-10-12 | - |
| dc.date.issued | 2015-05-28 | - |
| dc.identifier.citation | 65th Electronic Components and Technology Conference (ECTC) | - |
| dc.identifier.uri | http://hdl.handle.net/10203/203462 | - |
| dc.language | English | - |
| dc.publisher | 65th Electronic Components and Technology Conference (ECTC) | - |
| dc.title | Noise coupling emulation between TSV and active circuit through metal oxide patch | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000370285100305 | - |
| dc.identifier.scopusid | 2-s2.0-84942104373 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | 65th Electronic Components and Technology Conference (ECTC) | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Sheraton San Diego Hotel & Marina | - |
| dc.contributor.localauthor | Kim, Joungho | - |
| dc.contributor.nonIdAuthor | Jonghyun Cho | - |
| dc.contributor.nonIdAuthor | Jaemin Lim | - |
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