Results 1-10 of 60 (Search time: 0.013 seconds).
NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Quantized Canductance of a Gate-All-Around Silicon Quantum Wire Transistor Hyung-Cheol Shin, MNC(Microprocesses and Nanotechnology Conference, pp.150 - 151, 1998 | |
Fabrication of siliocon Quantum Dots on Oxide and Nitride Hyung-Cheol Shin, MNC(Microproceses and Nanotechnology Conference), pp.136 - 137, 1998 | |
Programming and Erasing Characteristics of P-channel Nano-crystal Memory Hyung-Cheol Shin, Semicon Korea Technical Symposium 2000, pp.5 - 10, 2000 | |
Characteristics of Thermal Nitride Grown by IR Furnace Hyung-Cheol Shin, IUMRS-ICEM-98, pp.106 - 106, 1998 | |
Characterization of Thin Oxide Damage During Aluminum Etching and Photoresist Ashing Processes Hyung-Cheol Shin, International Symposium on VLSI Technology,Systems and Applications, pp.210 - 213, 1991 | |
A Nonvolatile Memory Using Nanocrystals Formed by Wet Etching Hyung-Cheol Shin, ICSMM 2000, pp.124 - 125, 2000 | |
MOS Memory Using Si Nanocrystals Formed by Wet Etching of Poly-Silicon Along Grain Boundaries Hyung-Cheol Shin, 2000 Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices, pp.221 - 224, 2000 | |
Effect of Body Structure on Analog Performance of SOI NMOSFET's Hyung-Cheol Shin, IEEE SOI Conference, pp.61 - 62, 1998 | |
Silicon nano-crystal memory with tunneling nitride Hyung-Cheol Shin, International Conference on Solid State Devices and Materials, pp.170 - 171, 1998 | |
Factors Affecting Charge-up in a Magnetically Enhanced RIE Polysilicon Etcher Hyung-Cheol Shin, Proc. Electrochemical Society, pp.405 - 406, 1993 |
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