Results 21-30 of 34 (Search time: 0.003 seconds).
NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Materials, Device and Gate Oxide Integrith Evaluation of Simox and Bonded SOI Wafers Hyung-Cheol Shin, Proc. IEEE International SOI Conference, pp.143 - 145, 1995 | |
Integrity of Gate Oxide on TFSOI Materials Hyung-Cheol Shin, Proc. IEEE International SOI Conference, pp.22 - 23, 1995 | |
PMOS-based Si Nano-crystal Memory Hyung-Cheol Shin, Silicon nanoelectronics workshop, pp.10 - 11, 1999 | |
Characteristics of P-channel Si Nano-crystal Memory with Tunneling Oxide Hyung-Cheol Shin, 99 ISDRS, pp.73 - 75, 1999 | |
Characteristics of P-channel Si Nano-crystal Memory Hyung-Cheol Shin, IEEE Region 10 Ionference, TENCON, pp.1140 - 1142, 1999 | |
A self-assembled silicon quantum dot transistor operation at room temperature Hyung-Cheol Shin, NPMS'98, 1998 | |
Lateral Silicon Field Emission Devices using Electron Beam Lithography Hyung-Cheol Shin, Micoroprocesses and Nanotechnology'99, pp.134 - 135, 1999 | |
Transient Behaviors in Partially Depleted Thin Film SOI Devices Hyung-Cheol Shin, Proc. IEEE International SOI Conference, pp.4 - 6, 1995 | |
A self-assembled silicon quantum dot transistor operation at room temperature Hyung-Cheol Shin, Sound Quality Symposium Conference(SQS), 1998 | |
Characterization of oxide Charging in a Magnetically Enhanced Rie Polysilicon Etcher Hyung-Cheol Shin, Proc. 11th International Syposium on Plasma Chemistry, pp.1534 - 1539, 1993 |