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Results 1-10 of 30 (Search time: 0.01 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
Effect of magnetic field on the magnetic domain structure of MnAs film on GaAs(001)

Kim, JB; Lee, YP; Ryu, KS; Shin, Sung-Chul; Akinaga, H; Kim, KW, IEEE TRANSACTIONS ON MAGNETICS, v.42, pp.3249 - 3251, 2006-10

2
Effect of microstructures on the Gilbert damping in Co/Ni multilayers

Song, Hyon-Seok; Lee, Kyeong-Dong; Yang, See-Hun; Sohn, Jeong-Woo; Kim, Hyun Joong; You, Chun-Yeol; Park, Byong-Guk; Parkin, Stuart; Shin, Sung-Chul; Hong, Jung-Il, CURRENT APPLIED PHYSICS, v.16, no.10, pp.1349 - 1352, 2016-10

3
Strain-induced three-photon effects

Jeong, JW; Shin, Sung-Chul; Lyubchanskii, IL; Varyukhin, VN, PHYSICAL REVIEW B, v.62, no.20, pp.13455 - 13463, 2000-11

4
Correlation between fractal dimension and reversal behavior of magnetic domain in Co/Pd nanomultilayers

Kim, DH; Cho, YC; Choe, SB; Shin, Sung-Chul, APPLIED PHYSICS LETTERS, v.82, pp.3698 - 3700, 2003-05

5
Fine control of L1(0) ordering and grain growth kinetics by C doping in FePt films

Ko, HS; Perumal, A; Shin, Sung-Chul, APPLIED PHYSICS LETTERS, v.82, pp.2311 - 2313, 2003-04

6
Temperature dependence of growth morphology of sputtered (FePt/Pt) films on MgO(100) substrate

Kim, MG; Shin, Sung-Chul, JOURNAL OF APPLIED PHYSICS, v.90, no.5, pp.2211 - 2215, 2001-09

7
DEPENDENCE OF THE POLAR KERR ANGLE AND COERCIVITY ON REPEAT DISTANCE IN SEQUENTIALLY PREPARED TB/FECO FILMS

Shin, Sung-Chul, JOURNAL OF APPLIED PHYSICS, v.69, no.8, pp.4538 - 4540, 1991-04

8
Interface roughness effects on the surface anisotropy in Co/Pt multilayer films

Kim, JH; Shin, Sung-Chul, JOURNAL OF APPLIED PHYSICS, v.80, no.5, pp.3121 - 3123, 1996-09

9
Domain reversal simulation for anisotropy-energy fluctuation

Choe, SB; Shin, Sung-Chul, IEEE TRANSACTIONS ON MAGNETICS, v.36, no.5, pp.3169 - 1, 2000-09

10
EFFECTS OF PD PREDEPOSITION LAYER ON MAGNETIC-PROPERTIES IN COMPOSITIONALLY MODULATED CO/PD MULTILAYERS

YOU, CY; HUR, J; Shin, Sung-Chul, JOURNAL OF APPLIED PHYSICS, v.73, no.10, pp.5951 - 5953, 1993-05

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