Results 1-1 of 1 (Search time: 0.002 seconds).
NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
---|---|
Soft X-ray resonant Kerr rotation measurement and simulation of element-resolved and interface-sensitive magnetization reversals in a NiFe/FeMn/Co trilayer structure Kim, SK; Lee, KS; Kortright, JB; Shin, Sung-Chul, APPLIED PHYSICS LETTERS, v.86, pp.87 - 95, 2005-03 |
Discover