Showing results 1 to 2 of 2
Effect of complexing agent on the properties of electrochemically deposited Cu2ZnSnS4 (CZTS) thin films Pawar, B. S.; Pawar, S. M.; Shin, S. W.; Choi, D. S.; Park, C. J.; Kolekar, S. S.; Kim, J. H., APPLIED SURFACE SCIENCE, v.257, no.5, pp.1786 - 1791, 2010-12 |
Reactive ion etching mechanism of copper film in chlorine-based electron cyclotron resonance plasma Lee, SK; Chun , Soung Soon; Hwang, CY; Lee, Won-Jong, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.36, no.1A, pp.50 - 55, 1997-01 |
Discover