Showing results 1 to 9 of 9
Barrier Height Measurement of Metal Contacts to Si Nanowires Using Internal Photoemission of Hot Carriers Yoon, KunHo; Hyun, Jerome K.; Connell, Justin G.; Amit, Iddo; Rosenwaks, Yossi; Lauhon, Lincoln J., NANO LETTERS, v.13, no.12, pp.6183 - 6188, 2013-12 |
Clean and less defective transfer of monolayer graphene by floatation in hot water Kim, Ji-Weon; Woo, Ju Yeon; Jo, Sunghwan; Oh, Jun Ho; Hong, Woonggi; Lee, Byung Chul; Jung, Hyun-June; et al, APPLIED SURFACE SCIENCE, v.508, 2020-04 |
EFFECTS OF PLASMA CHARGING DAMAGE ON THE NOISE PERFORMANCE OF THIN-OXIDE MOSFETS MA, ZJ; Shin, Hyung-Cheol; KO, PK; HU, C, IEEE ELECTRON DEVICE LETTERS, v.15, no.6, pp.224 - 226, 1994-06 |
Emerging Trends in Flexible Active Multielectrode Arrays Lee, Wonryung; Someya, Takao, CHEMISTRY OF MATERIALS, v.31, no.17, pp.6347 - 6358, 2019-09 |
Graphene and Two-Dimensional Materials-Based Flexible Electronics for Wearable Biomedical Sensors Joe, Daniel J. J.; Park, Eunpyo; Kim, Dong Hyun; Doh, Il; Song, Hyun-Cheol; Kwak, Joon Young, ELECTRONICS, v.12, no.1, 2023-01 |
Highly uniform carbon nanotube nanomesh network transistors Choi, Sung-Jin; Bennett, Patrick; Lee, Dongil; Bokor, Jeffrey, NANO RESEARCH, v.8, no.4, pp.1320 - 1326, 2015-04 |
Influence of Dielectric Layers on Charge Transport through Diketopyrrolopyrrole-Containing Polymer Films: Dielectric Polarizability vs Capacitance Lee, Jiyoul; Chung, Jong Won; Yoon, Gyu Bok; Lee, Moo Hyung; Kim, Do Hwan; Park, Jozeph; Lee, Jin-Kyun; et al, ACS APPLIED MATERIALS & INTERFACES, v.8, no.44, pp.30344 - 30350, 2016-11 |
Nanowire Heterostructures Hyun, Jerome K.; Zhang, Shixiong; Lauhon, Lincoln J., Annual Review of Materials Research, v.43, pp.451 - 479, 2013 |
Thin-Film Morphology of Inkjet-Printed Single-Droplet Organic Transistors Using Polarized Raman Spectroscopy: Effect of Blending TIPS-Pentacene with Insulating Polymer James, David T.; Kjellander, B. K. Charlotte; Smaal, Wiljan T. T.; Gelinck, Gerwin H.; Combe, Craig; McCulloch, Iain; Wilson, Richard; et al, ACS NANO, v.5, no.12, pp.9824 - 9835, 2011-12 |
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