Browse "RIMS Journal Papers" by Author Racanelli, M
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| Measurement of carrier generation lifetime in SOI devices Shin, Hyung-Cheol; Racanelli, M; Huang, WM; Foerstner, J; Hwang, T; Schroder, DK, SOLID-STATE ELECTRONICS, v.43, no.2, pp.349 - 353, 1999-02 |
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