Browse "RIMS Journal Papers" by Author KANG, SW

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EFFECT OF LATTICE DAMAGE ON IMPURITY DEPTH PROFILES IN BF2+-IMPLANTED SILICON

PAEK, MC; Lim, Ho Bin; KWON, OJ; KANG, SW, SURFACE & COATINGS TECHNOLOGY, v.43, no.1-3, pp.986 - 995, 1990-12

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