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Seebeck Coefficient Characterization of Highly Doped n- and p-Type Silicon Nanowires for Thermoelectric Device Applications Fabricated with Top-Down Approach

Kim, Jaehyeon; Hyun, Younghoon; Park, Youngsam; Choi, Wonchul; Kim, Soojung; Jeon, Hyojin; Zyung, Taehyeong; et al, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.13, no.9, pp.6416 - 6419, 2013-09

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