Browse "School of Mechanical and Aerospace Engineering(기계항공공학부)" by Author You, Joonho
Showing results 3 to 4 of 4
| GPU-accelerated white-light scanning interferometer for large-area, high-speed surface profile measurements You, Joonho; KIM, Young-Jin; Kim, Seung-Woo, INTERNATIONAL JOURNAL OF NANOMANUFACTURING, v.8, no.1-2, pp.31 - 39, 2012-01 |
| Oxide thickness profile measurement by dispersive white-light interferometry in CMP process Jeong, Haedo; Park, Boumyoung; Kim, Youngjin; Kim, Hyoungjae; Ghim, Young-Sik; You, Joonho; Kim, Seung-Woo, 2007 International Conference on Planarization/CMP Technology, ICPT 2007, pp.179 - 186, VDE Verlag GmbH, 2007-10 |
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