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Direct quadratic polynomial fitting for fringe peak detection of white light scanning interferograms Park, MC; Kim, Seung-Woo, OPTICAL ENGINEERING, v.39, no.4, pp.952 - 959, 2000-04 |
Volumetric phase-measuring interferometer for three-dimensional coordinate metrology Kim, Seung-Woo; Rhee, H.-G.; Chu, J.-Y., PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, v.27, no.2, pp.205 - 215, 2003 |
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