Browse "School of Electrical Engineering(전기및전자공학부)" by Title 

Showing results 17261 to 17280 of 51620

17261
Error reduction of SRAM-based physically unclonable function for chip authentication

Kim, Moon-Seok; Kim, Sunho; Yoo, Sang-Kyung; Lee, Bong-Soo; Yu, Ji-man; Tcho, Il-Woong; Choi, Yang-Kyu, INTERNATIONAL JOURNAL OF INFORMATION SECURITY, v.22, no.5, pp.1087 - 1098, 2023-10

17262
Error resilient texture coding scheme for wireless video transmission based on coefficient sampling and interleaving

Kim, Minsup; Lee, Si-Woong; Kim, Seong-Dae, OPTICAL ENGINEERING, v.44, no.12, pp.S48 - S50, 2005-12

17263
Error Tolerance Bound for Multi-Qubit QKD Security Against General Attack

Lim, Kyong Chun; Rhee, June Koo Kevin; Kim, Ki Yeong; Suh, Chang Ho, QCrypt 2015, QCrypt, 2015-09-29

17264
Error-Pattern-Correcting Cyclic Codes Tailored to a Prescribed Set of Error Cluster Patterns

Park, Jihoon; Moon, Jaekyun, IEEE TRANSACTIONS ON INFORMATION THEORY, v.55, no.4, pp.1747 - 1765, 2009-04

17265
Escape!: An Indoor Location-based Horror Game Using Indirect Ambient Cues

Lee, S; Lee, S; Heo, S; Park, KS; Hahn, Minsoo, International Symposium on Ubiquitous Computing Systems, pp.35 - 36, UCS, 2007-11-25

17266
ESD Characteristics of GaAs versus Silicon Diode

Park, Changkun; Yun, Seok-Oh; Han, Jeonghu; Cheon, Sang-Hoon; Park, Jae-Woo; Hong, Songcheol, 13th Gallium Arsenide and other Compound Semiconductors Application Symposium, pp.273 - 276, 2005-10

17267
ESD: Expected Squared Difference as a Tuning-Free Trainable Calibration Measure

Yoon, Hee Suk; Tee, Joshua Tian Jin; Yoon, Eunseop; Yoon, Sunjae; Kim, Gwangsu; Li, Yingzhen; Yoo, Chang-Dong, International Conference on Learning Representations (ICLR) 2023, International Conference on Learning Representations, 2023-05-02

17268
ESEU--A hardware architecture for fast image generation

Bang, Kyung-Il; Bae, Seong-Ok; Kyung, Chong-Min, 1990 IEEE International Symposium on Circuits and Systems Part 4 (of 4), v.1, pp.73 - 76, 1990-05-01

17269
ESP-Scheme: A Realization of System Entity Structure in a LISP Environment

Kim, Tag-Gon; Zeigler, B. P., in Advances in AI and Simulation, Simulation Series, pp.135 - 140, ACM, 1989-03

17270
ESR and magnetic susceptibility studies in polycrystalline hydrogenated ZnO films grown by photo-MOCVD

Lim, Koeng Su; Shevaleevskiy, O; Tsvetkov, A; Skatchkov, M; Yang, JH, 23rd International Conference on Amorphous and Nanocrystalline Semiconductors, pp.50 -, 2009

17271
ESR Studies of Defects in Intrinsic and Boron-Doped Hydrogenated nc-SiC:H Films Prepared by Photo-CVD

Lim, Koeng Su; Shevaleevskiy, O; Myong, SY, ICANS21, 2005

17272
ESR studies of hydrogen-induced paramagnetic defects in polycrystalline ZnO films

Shevaleevskiy, Oleg; Myong, Seung Yeop; Tsvetkov, Nikolai; Lim, Koeng Su, JOURNAL OF NON-CRYSTALLINE SOLIDS, v.354, no.19-25, pp.2849 - 2852, 2008-05

17273
ESR Studies of Hydrogenated Nanocrystalline Silicon Carbide for Solar Cells Application

Lim, Koeng Su, Proceddings of the 3rd World Conference on Photovoltaic Energy Conversion, 2003, pp.1859 - 1862, 2003-05-11

17274
eSRCNN: A Framework for Optimizing Super-Resolution Tasks on Diverse Embedded CNN Accelerators

Jung, Youngbeom; Choi, Yeongjae; Sim, Jaehyeong; Kim, Lee-Sup, 38th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2019, IEEE/ACM, 2019-11-04

17275
Establishing Co-Continuous Network of Conjugated Polymers and Elastomers for High-Performance Polymer Solar Cells with Extreme Stretchability

Lee, Jin-Woo; Nguyen, Trieu Hoang-Quan; Oh, Eun Sung; Lee, Seungbok; Choi, Jae Young; Kwon, Hyun Soo; Wang, Cheng; et al, ADVANCED ENERGY MATERIALS, v.14, no.26, 2024-07

17276
Establishment of protection paths using maximum degree of sharing in WDM networks

Li, JQ; Park, Hong-Shik; Lee, HH, IEICE TRANSACTIONS ON COMMUNICATIONS, v.E86B, pp.1109 - 1116, 2003-03

17277
Estimating Flash Crowds based on Modeling Study in a P2P Live Streaming Service

Park, Hong-Shik, Triangle Symposium on Advanced ICT 2011, Triangle Symposium on Advanced ICT 2011, 2011-08-25

17278
Estimating intrinsic parameters of cameras using two arbitrary rectangles

Kim, J.-S.; Kweon, In-So, 18th International Conference on Pattern Recognition, ICPR 2006, pp.707 - 710, IEEE, 2006-08-20

17279
Estimating Scene-Oriented Pseudo Depth With Pictorial Depth Cues

Lee, Jaeho; Yoo, Seungwoo; Kim, Changick; Vasudev, Bhaskaran, IEEE TRANSACTIONS ON BROADCASTING, v.59, no.2, pp.238 - 250, 2013-06

17280
Estimating the number of people in crowded scenes

Kim, M; Kim, W; Kim, Changick, SPIE Visual Information Processing and Communication II, 2011, SPIE Visual Information Processing and Communication II, 2011, 2011-01-25

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