Showing results 17021 to 17040 of 50973
Error cost function for mirror-based three-dimensional reconstruction Chang, Won-Il; Cho, Keeseong; Ryu, Won; Lee, Soo-Young, ELECTRONICS LETTERS, v.50, no.16, pp.1134 - 1135, 2014-07 |
Error detection in digital elevation model using a camera image Jeon, Young Woo; Bae, Yoonsung; Ra, Jong Beom, International Geoscience and Remote Sensing Symposium, pp.2517 - 2519, IEEE, 2013-07-24 |
Error exponents in asynchronous communication Wang, Da; Chander, V.; Chung, Sae-Young; Wornell, G, IEEE International Symposium on Information Theory, pp.1071 - 1075, IEEE, 2011-07 |
Error Minimization Generalization and hardware Implementability of Supervised Learning Lee, Soo-Young; Jeong, D.G., World Concress Neural Networks, 1994-06 |
Error performance analysis of STBC-Alamouti and STBC-CIOD with phase estimation error over Nakagami-m fading channels Ha, Daehan; Lee, Hoojin; Kang, Joonhyuk, ELECTRONICS LETTERS, v.52, no.6, pp.452 - 453, 2016-03 |
Error probability bounds for bit-interleaved space-time trellis coding over block-fading channels Li, Yong; Moon, Jaekyun, IEEE TRANSACTIONS ON INFORMATION THEORY, v.53, no.11, pp.4285 - 4292, 2007-11 |
Error reduction in inter-layer motion prediction using FGS refined motion Yoo, H.; Lee, D.S.; Jin, S.H.; Bae, T.M.; Ro, YongMan, SPIE Visual Communications and Image Processing 2008, v.6822, pp.0 - 0, 2008-01-29 |
Error reduction in reconstruction of kinoform CGH patterns for a hologram ID tag system Kim, H.-R.; Pak, K.-M.; Lim, J.-S.; Won, Y.-H., SPIE Optical Data Storage Topical meeting 2010, SPIE Optical Data Storage Topical meeting 2010, 2010-05-23 |
Error reduction of SRAM-based physically unclonable function for chip authentication Kim, Moon-Seok; Kim, Sunho; Yoo, Sang-Kyung; Lee, Bong-Soo; Yu, Ji-man; Tcho, Il-Woong; Choi, Yang-Kyu, INTERNATIONAL JOURNAL OF INFORMATION SECURITY, v.22, no.5, pp.1087 - 1098, 2023-10 |
Error resilient texture coding scheme for wireless video transmission based on coefficient sampling and interleaving Kim, Minsup; Lee, Si-Woong; Kim, Seong-Dae, OPTICAL ENGINEERING, v.44, no.12, pp.S48 - S50, 2005-12 |
Error Tolerance Bound for Multi-Qubit QKD Security Against General Attack Lim, Kyong Chun; Rhee, June Koo Kevin; Kim, Ki Yeong; Suh, Chang Ho, QCrypt 2015, QCrypt, 2015-09-29 |
Error-Pattern-Correcting Cyclic Codes Tailored to a Prescribed Set of Error Cluster Patterns Park, Jihoon; Moon, Jaekyun, IEEE TRANSACTIONS ON INFORMATION THEORY, v.55, no.4, pp.1747 - 1765, 2009-04 |
Escape!: An Indoor Location-based Horror Game Using Indirect Ambient Cues Lee, S; Lee, S; Heo, S; Park, KS; Hahn, Minsoo, International Symposium on Ubiquitous Computing Systems, pp.35 - 36, UCS, 2007-11-25 |
ESD Characteristics of GaAs versus Silicon Diode Park, Changkun; Yun, Seok-Oh; Han, Jeonghu; Cheon, Sang-Hoon; Park, Jae-Woo; Hong, Songcheol, 13th Gallium Arsenide and other Compound Semiconductors Application Symposium, pp.273 - 276, 2005-10 |
ESD: Expected Squared Difference as a Tuning-Free Trainable Calibration Measure Yoon, Hee Suk; Tee, Joshua Tian Jin; Yoon, Eunseop; Yoon, Sunjae; Kim, Gwangsu; Li, Yingzhen; Yoo, Chang-Dong, International Conference on Learning Representations (ICLR) 2023, International Conference on Learning Representations, 2023-05-02 |
ESEU--A hardware architecture for fast image generation Bang, Kyung-Il; Bae, Seong-Ok; Kyung, Chong-Min, 1990 IEEE International Symposium on Circuits and Systems Part 4 (of 4), v.1, pp.73 - 76, 1990-05-01 |
ESP-Scheme: A Realization of System Entity Structure in a LISP Environment Kim, Tag-Gon; Zeigler, B. P., in Advances in AI and Simulation, Simulation Series, pp.135 - 140, ACM, 1989-03 |
ESR and magnetic susceptibility studies in polycrystalline hydrogenated ZnO films grown by photo-MOCVD Lim, Koeng Su; Shevaleevskiy, O; Tsvetkov, A; Skatchkov, M; Yang, JH, 23rd International Conference on Amorphous and Nanocrystalline Semiconductors, pp.50 -, 2009 |
ESR Studies of Defects in Intrinsic and Boron-Doped Hydrogenated nc-SiC:H Films Prepared by Photo-CVD Lim, Koeng Su; Shevaleevskiy, O; Myong, SY, ICANS21, 2005 |
ESR studies of hydrogen-induced paramagnetic defects in polycrystalline ZnO films Shevaleevskiy, Oleg; Myong, Seung Yeop; Tsvetkov, Nikolai; Lim, Koeng Su, JOURNAL OF NON-CRYSTALLINE SOLIDS, v.354, no.19-25, pp.2849 - 2852, 2008-05 |
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