Browse "School of Electrical Engineering(전기및전자공학부)" by Title
Showing results 8601 to 8620 of 50972
| Analysis of carrier based PWM methods in relation to common mode voltage for multilevel inverter Van, NN; Moon, G.-W.; Youn, Myung Joong, IECON 2004 - 30th Annual Conference of IEEE Industrial Electronics Society, pp.1811 - 1816, IEEE, 2004-11-02 |
| Analysis of CDMA using new orthogonal sequences Park, S.I.; Yoon, S.H.; Kim, K.S.; Kim, S.C.; Kim, Y.H.; Song, Iickho, Int. Technical Conf. Circuits/Systems, Comp., Comm. (ITC-CSCC), pp.825 - 828, 1998-07 |
| Analysis of CFO Estimation for QAM-FBMC Systems Considering Non-Orthogonal Prototype Filters Han, Hyungsik; Kim, Namshik; Park, Hyuncheol, IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY, v.68, no.7, pp.6761 - 6774, 2019-07 |
| Analysis of Channel Characteristic for Body Channel Communication Transceiver Design Jang, Jaeeun; Yoo, Hoi-Jun, 14th EAI International Conference on Body Area Networks, BodyNets 2019, pp.374 - 383, Springer, 2019-10 |
| Analysis of charge trapping and breakdown mechanism in high-K dielectrics with metal gate electrode using carrier separation Cho, Byung Jin; Loh, WY; Joo, MS; Li, MF; Chan, DSH; Kwong, DL, International Electron Device Meeting (IEDM), pp.0 - 0, 2003-12-08 |
| Analysis of Cingestion Control in KT Signaling System No.7 Sung, Dan Keun; Choi, SH; Choi, BD; Song, GS, JCCI, pp.926 - 930, 1998-01 |
| Analysis of concatenated long period fiber gratings having phase-shifted and cascaded effects Kim, H; Bae, J; Lee, JW; Chun, Joohwan; Lee, SB, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.42, no.8, pp.5098 - 5101, 2003-08 |
| Analysis of Control Architectures of Mobile Printer System based on Multi-robot Cooperation Kim, Jong-Hwan, FIRA Robot World Congress, pp.249 - 254, 2002-05-01 |
| Analysis of Control Overhead Reduction by Semi-Persistent Scheduling Cho, Seungkwon; Kim, Yongjae; Han, Youngnam, IEEE WIRELESS COMMUNICATIONS LETTERS, v.9, no.5, pp.726 - 730, 2020-05 |
| Analysis of Controller and Sensor Fault Tolerant System Using Fuzzy Logic 변증남, '96 한국퍼지 및 지능시스템 학회 춘계 학술대회 논문집, pp.53 - 58, 1996 |
| Analysis of correlated errors in noisy detectors with IBM quantum computer 서승찬; 배준우, 제29회 광전자 및 광통신 학술대회 (COOC 2022), 한국광학회, 2022-05-26 |
| Analysis of coupled inset dielectric guide structure Cho, YH; Eom, Hyo Joon, IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, v.49, no.7, pp.1329 - 1332, 2001-07 |
| Analysis of coupling and radiation characteristics of two groove-backed antennas = 그루브 안테나의 상호결합 및 복사해석link Yang, Dong-Il; 양동일; et al, 한국과학기술원, 2005 |
| Analysis of coupling between array of open-ended coaxial lines in an infinite ground plane Park, YB; Eom, Hyo Joon; Hwang, KC, IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, v.53, pp.2768 - 2772, 2005-08 |
| Analysis of Coupling Coefficient Between Tow Vertical Cavity Surface Emitting Lasers for Two-Dimensional Phase-Locked Array Yoo, Hoi-Jun; J.R.Hayes; Kwon, Young Se, ELECTRONICS LETTERS, v.26, 1990-06 |
| Analysis of coupling suppression methods on split power/ground planes using embedded capacitor in multi-layered package Jeong, Y.; Lu, A.C.W.; Wai, L.L.; Fan, W.; Lok, B.K.; Kim, Joungho, 2004 Proceedings - 54th Electronic Components and Technology Conference, pp.575 - 580, IEEE, 2004-06-01 |
| Analysis of Cramer-Rao Lower Bound for Time Delay Estimation using UWB Pulses Yun, Seonghun; Kim, Sujin; Koh, Jeongwan; Kang, Joonhyuk, IEEE 2nd Ubiquitous Positioning, Indoor Navigation, and Location Based Service, IEEE, 2012-10-03 |
| Analysis of Critical Race Combined Circuit with Timed Discrete Event Model Lee, MS; Cho, Kwang-Hyun; Lim, Jong-Tae, 4th International Conference On Mechatronic Technology, pp.538 - 540, 1999-10 |
| Analysis of CSMA/CA systems under carrier sensing error: Throughput, delay and sensitivity Jowoon Chong; Sung, Youngchul; Sung, Dan Keun, 2008 IEEE Global Telecommunications Conference, GLOBECOM 2008, pp.4934 - 4939, IEEE, 2008-11-30 |
| Analysis of Damage Curing in a MOSFET with Joule Heat Generated by Forward Junction Current at the Source and Drain Lee, Geon-Beom; Kim, Choong-Ki; Bang, Tewook; Yoo, Min-Soo; Park, Jun-Young; Choi, Yang-Kyu, MICROELECTRONICS RELIABILITY, v.104, 2020-01 |
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