Browse "School of Electrical Engineering(전기및전자공학부)" by Title 

Showing results 27581 to 27600 of 51627

27581
No. 7 신호망을 이용한 지능망의 성능평가 = Performance analysis of intelligent networks based on the No. 7 signaling systemlink

정민영; Chung, Min-Young; et al, 한국과학기술원, 1994

27582
Nobel collision-free OBS ring access protocol

Park, J.-P.; Lee M.-S., COIN-NGNCON 2006 - The Joint International Conference on Optical Internet and Next Generation Network, pp.106 - 108, 2006-07-09

27583
A Noble Error-free Optical Code-Division Multiple-Access System Using

Lim, Yu-taek; Min, Seong-sik; Yoo, Hark; Won, Yong Hyub, COIN/ACOFT Proceedings, 2003-07-13

27584
NoC 기반 MIMO-OFDM 수신기의 트렌젝션 수준 분석

Sin-Chong Park, ITSoC 학회, pp.0 - 0, 2005-11-01

27585
Node dimensioning in optical burst switching networks

Choi, JungYul; Choi, JinSeek; Kang, Min Ho, PHOTONIC NETWORK COMMUNICATIONS, v.13, no.2, pp.207 - 216, 2007

27586
Node Sampling Technique to Speed Up Probability-Based Power Estimation Methods

Choi, H; Kim, H; Park, In-Cheol; Hwang, Seung-Ho; Kyung, Chong-Min, Asia and South Pacific Design Automation Conference, pp.157 - 160, ASP-DAC, 1999-01

27587
Noise Analysis and Modeling of Microwave AlGaN/GaN HEMTs Considering Trap Effects

Hwang, M; Yang, Kyounghoon, International Joint Conference of MINT-MIS 2005/TSMMW 2005, pp.136 - 139, 2005

27588
Noise analysis of a wavelength-locked Fabry-Perot laser diode

Park, K.-Y.; Lee, Chang-Hee, 2008 7th International Conference on the Optical Internet, COIN 2008, pp.1 - 2, 2008-10-14

27589
Noise analysis of replica driving technique and its verification to 12-bit 200 MS/s pipelined ADC

Lee, Chang-Kyo; Ryu, Seung-Tak, IET CIRCUITS DEVICES & SYSTEMS, v.13, no.8, pp.1277 - 1283, 2019-11

27590
Noise and Gain Optimization Technique for RF Integrated CMOS Low Noise Amplifier

Lee, Sang-Gug, IEEE International Conference on Electronic Devices and Solid-State Circuits, v.0, no.0, pp.221 - 224, IEEE International Conference on Electronic Devices and Solid-State Circuits, 2003-12-01

27591
Noise and Interference Characterization for MLC Flash Memories

Moon, Jaekyun; No, J.; Lee, S.; Kim, S.; Yang, J.; Chang, S., International Conference on Computing, Networking and Communications 2012, IEEE, 2012-01-30

27592
Noise aware depth denoising for a time-of-flight camera

Kweon, In-So; Jung, Jiyoung; Lee, Joon Young, 20th Korea-Japan Joint Workshop on Frontiers of Computer Vision, Asian Federation of Computer Vision (AFCV), 2014-02-05

27593
Noise bandwidth suppression circuit for low noise IRFPA

Kim, B.; Kang, S.-G.; Lee, Hee Chul; Kim, C.-K., Infrared Technology and Applications XXVIII, v.4820, no.1, pp.327 - 333, 2002-07-07

27594
Noise bandwidth suppression for low noise readout circuit

Kim, B; Lee, Hee Chul, ELECTRONICS LETTERS, v.38, no.12, pp.558 - 560, 2002-06

27595
Noise cancelling with autoassociative memory trained by order statistics

Bae, J; Ryu, Y; Song, Iickho, Proceedings of the 1994 IEEE International Conference on Neural Networks. Part 1 (of 7), v.5, pp.3431 - 3436, 1994-06-27

27596
Noise Capacitive Sensor for Multi-Touch Mobile Handset's Applications

Ko, S.; Shin, H.; Lee, J.; Jang, H.; So, B.-C.; Yun, I.; Lee, Kwyro, IEEE ASIAN SOLID-STATE CIRCUITS CONF., pp.113 - 116, IEEE, 2009-12

27597
Noise Characteristics of a Wavelength-Locked Fabry-Perot Laser Diode

Park, Kun-Youl; Lee, Chang-Hee, IEEE JOURNAL OF QUANTUM ELECTRONICS, v.44, no.11-12, pp.995 - 1002, 2008

27598
Noise coupling analysis and reduction in 3D-IC considering through-silicon via (TSV) nonlinearity = 3차원 집적회로에서 TSV의 비선형성을 고려한 노이즈 커플링 분석 및 감소에 관한 연구link

Cho, Jong-Hyun; 조종현; et al, 한국과학기술원, 2013

27599
Noise Coupling Analysis between TSV and Active Circuit

Kim, Joungho; Jonghyun Cho, 2012 IEEE Electrical Design of Advanced Package & Systems Symposium, EDAPS2012, 2012-12-10

27600
Noise coupling analysis method for an electronic safety and arming device (ESAD)

Kang, Hyungmin; Kim, Subin; Lho, Daehwan; Park, Hyunwook; Sim, Boogyo; Kim, Joungho, 2019 Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2019, Institute of Electrical and Electronics Engineers Inc., 2019-12

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