Browse "School of Electrical Engineering(전기및전자공학부)" by Title
Showing results 24921 to 24940 of 51623
| Measurement of eye-penalty based on the clock amplitude of transmitted signal Lee, JN; Lee, Chang-Hee; Shin, Sang Yung, OPTICAL AND QUANTUM ELECTRONICS, v.33, no.12, pp.1187 - 1193, 2001-12 |
| Measurement of facet reflectivity through reflection gain in Fabry-Perot laser diode Jeong, JS; Lee, HK; Lee, Chang-Hee, IEEE PHOTONICS TECHNOLOGY LETTERS, v.20, no.14, pp.1225 - 1227, 2008-07 |
| Measurement of High-bandwidth and High-density Silicone Rubber Socket up to 110GHz Park, Junyong; Kim, Joungho; Kim, Hyesoo; Kim, Jonghoon J; Bae, Bumhee; Ha, Dongho; Bae, Michael, 66th Electronic Components and Technology Conference (ECTC), 66th Electronic Components and Technology Conference (ECTC), 2016-05-31 |
| Measurement of implantation profile by MOS C-V characteristiclink 정진국; Chung, Jin-Kuk; et al, 한국과학기술원, 1977 |
| Measurement of Initial Motion of a Flying Golf Ball with Multi-Exposure images for Screen-golf Jung, Jae-Wook; Park, Han-Bit; Kang, Shin; Lee, Seung-Woo; Hahn, Min-Soo, IEEE TRANSACTIONS ON CONSUMER ELECTRONICS, v.56, no.2, pp.516 - 523, 2010-05 |
| Measurement of Machine Intelligence of Surface Mounting Machine using Choquet Integral Kim, Jong-Hwan, World Automation Congress, pp.621 - 626, 1998-05-01 |
| Measurement of Magnetic Susceptibility Effect in High Field NMR Imaging Ro, YongMan; Park, HyunWook; Cho, ZH, Sociey of Magnetic Rosonance in Medicine, pp.778 - 778, 1987-08-17 |
| Measurement of Picosecond Pulse Propagation Characteristics on Coplanar Transmission Lines Kim, Joungho; Lee, Jongjoo; Yu, S., 5th IEEE Workshop on Signal Propagation on Interconnects, IEEE, 2001 |
| Measurement of Reactor-Relevant Electromagnetic Effects with the FELIX Facility L.R.Turner; T.Q.Hua; R.B.Wehrle; M.J.Knott; Lee, Soo-Young; D.G.McGhee, FUSION TECHNOLOGY, v.10, pp.1053 - 1058, 1986-11 |
| Measurement of RTI Performance for Tuning Parameters to Improve Federation Performance in Real-time War Game Simulation Kim, Tag-Gon; Hong, Su-Youn; Kim, Jae-Hyun, Summer Computer Simulation Conference 2005, 2005-07 |
| Measurement of Structural Displacement Using Visually Servoded Paired Structured Light System Jeon, Haemin; Bang, Yousuk; Myung, Hyun, ISARC 2011 (Int’l Symposium on Automation and Robotics in Construction), pp.189 - 192, Automation and Robotics in Construction, 2011-06 |
| Measurement of tag confidence in user generated contents retrieval Lee, S.; Min, H.-S.; Lee, Y.B.; Ro, YongMan, Visual Communications and Image Processing 2009, v.7257, SPIE, 2009-01-20 |
| Measurement of the Effective Internet Diameter Based on Hop Counts of Effective Connections 김재균, KISS, 1999 |
| Measurement of the magnetic susceptibility effect in high-field NMR imaging Park, HyunWook; Ro, Y.M.; Cho, Jang-Hee, Physics in Medicine and Biology, v.33 no.3, pp.339-349, 1988 |
| MEASUREMENT OF THE MAGNETIC-SUSCEPTIBILITY EFFECT IN HIGH-FIELD NMR IMAGING Park, HyunWook; Ro, YongMan; CHO, ZH, PHYSICS IN MEDICINE AND BIOLOGY, v.33, no.3, pp.339 - 349, 1988-03 |
| Measurement of the Modulated Scattering Microwave Fields Using Dual-Phase Lock-in Amplifier Choi J.-H.; Moon J.-I.; Park, SeongOok, IEEE ANTENNAS AND WIRELESS PROPAGATION LETTERS, v.3, pp.340 - 343, 2004 |
| Measurement of the space-time relation in quantum coherence propagation Wang, L.J.; Rhee, June-Koo Kevin, International Quantum Electronics Conference, vol. 7, 1998 OSA Technical Digest Series, pp.134 - 135, OSA, 1998-05 |
| Measurement of the steady-state minority carrier diffusion length in a HgCdTe photodiode Jung, H; Lee, Hee Chul; Kim, CK, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.35, no.10B, pp.1321 - 1323, 1996-10 |
| Measurement of Transmission Properties of HBC Channel and Its Impulse Response Model Hwang, Jung Hwan; Kang, Tae Wook; Kim, Youn Tae; Park, Seong-Ook, IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.65, no.1, pp.177 - 188, 2016-01 |
| Measurement protection in prepare-and-measure quantum key distribution Bae, Joonwoo, Quantum Communications and Quantum Imaging XVIII, SPIE (Optical Society of America), 2020-08-24 |
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