Browse "School of Electrical Engineering(전기및전자공학부)" by Title 

Showing results 20341 to 20360 of 50978

20341
High-frequency Electrical Model of Chip-to-Chip Via Interconnection for 3-D Chip Stacking Package

Kim, Joungho; Ryu, Chunghyun; Chung, Daehyun; Lee, Junho; Lee, Kwangyong; Oh, Taesung, IEEE 14th(13) Topical Meeting on Electrical Performance of Electronic Packaging, pp.151 - 154, IEEE, 2005-10

20342
High-frequency electrical performance of a new high-density Multiple Line Grid Array (MLGA) package

Ahn, Seungyoung; Lee, Joon-Woo; Kim, Jonghoon; Ryu, Woongwhan; Kim, Young-Soo; Yoon, Chong K.; Kim, Joungho, 50th Electronic Components and Technology Conference, pp.497 - 501, Electronic Components and Technology Conference, 2000-05

20343
High-frequency Measurements of TSV failures

Kim, Joohee; Cho, Jonghyun; Pak, Jun So; Kim, Joungho; Yook, Jong-Min; Kim, Jun Chul, 62nd Electronic Components and Technology Conference (ECTC), 62nd Electronic Components and Technology Conference (ECTC), 2012-05-29

20344
High-Frequency Modeling and Signal Integrity Analysis of a Silicone Rubber Socket for High-Performance Package

Kim, Hyesoo; Kim, Jonghoon J.; Park, Junyong; Park, Shinyoung; Choi, Sumin; Bae, Bumhee; Ha, DongHo; et al, IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, v.7, no.8, pp.1356 - 1368, 2017-08

20345
High-frequency modeling and signal integrity analysis of high-density silicone rubber socket

Kim, Hyesoo; Park, Junyong; Park, Shinyoung; Kim, Jonghoon J; Kim, Joungho; Ha, Dongho; Bae, Michael; et al, IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016, pp.55 - 57, Institute of Electrical and Electronics Engineers Inc., 2016-12

20346
High-frequency on-chip inductance model

Sim, SP; Lee, Kwyro; Yang, CY, IEEE ELECTRON DEVICE LETTERS, v.23, no.12, pp.740 - 742, 2002-12

20347
High-Frequency Performance of GaAs Floated Electron Channer FET(FECFET)

Kwon, Young Se, International Conference on VLSI and CAD, 1993

20348
HIGH-FREQUENCY RESONANT AC/DC RECTIFIER WITH UNITY POWER-FACTOR

CHOI, HC; HAN, JW; Youn, Myung Joong, ELECTRONICS LETTERS, v.28, no.17, pp.1592 - 1594, 1992-08

20349
High-Frequency Scalable Electrical Model and Analysis of a Through Silicon Via (TSV)

Kim, Joo-Hee; Pak, Jun-So; Cho, Jong-Hyun; Song, Eak-Hwan; Cho, Jeong-Hyeon; Kim, Hee-Gon; Song, Tai-Gon; et al, IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, v.1, no.2, pp.181 - 195, 2011-02

20350
High-Frequency Scalable Modeling and Analysis of a Differential Signal Through-Silicon Via

Kim, Joo-Hee; Cho, Jong-Hyun; Kim, Joungho; Yook, Jong-Min; Kim, Jun Chul; Lee, Junho; Park, Kunwoo; et al, IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, v.4, no.4, pp.697 - 707, 2014-04

20351
High-frequency scalable modeling of a through silicon via (TSV) and proposal of a failure detection method of 3D ICs = 3차원 집적회로에서 TSV의 고주파 모델링 및 TSV 불량 검출 방법에 관한 연구link

Kim, Joo-Hee; 김주희; et al, 한국과학기술원, 2013

20352
HIGH-FREQUENCY SIGNAL PREDISTORTION DEVICE AND NONLINEAR DISTORTION CORRECTING DEVICE FOR POWER AMPLIFIER

이용훈; 이상일; 김민현; 설영욱; 정의림; 홍순일; 김성진; et al, 2018-03-20

20353
High-frequency silicone rubber socket modeling and reliability investigations = 실리콘 고무 소켓의 고주파 모델링과 신뢰성 분석link

Kim, Hyesoo; 김혜수; et al, 한국과학기술원, 2016

20354
High-frequency SPICE model of anisotropic conductive film flip-chip interconnections based on a genetic algorithm

Ryu, Woonghwan; Yim, Myung-Jin; Ahn, Seungyoung; Lee, Junho; Kim, Woopoung; Paik, Kyung-Wook; Kim, Joungho, IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, v.23, no.3, pp.542 - 545, 2000-09

20355
High-frequency switching class-D power amplifier for portable sound applications

Choi, B.K.; Hong, Y.U.; Kwak, T.W.; Lee, M.C.; Cho, Gyu-Hyeong, 37th IEEE Power Electronics Specialists Conference 2006, PESC'06, pp.1 - 4, IEEE, 2006-06-18

20356
High-Frequency Temperature-Dependent Through-Silicon-Via (TSV) Model and High-Speed Channel Performance for 3-D ICs

Lee, Man Ho; Jung, Daniel Hyunsuk; Kim, Hee-Gon; Cho, Jong-Hyun; Kim, Joungho, IEEE DESIGN & TEST OF COMPUTERS, v.33, no.2, pp.17 - 29, 2016-03

20357
High-frequency TSV Failure Detection Method with Z parameter

Kim, Joohee; Jung, Daniel H; Chok, Jonghyun; Pak, Jun So; Yook, Jong Min; Kim, Jun Chul; Kim, Joungho, IEEE 38th International symposium of Test and Failure Analysis (ISTFA), IEEE, 2012-11

20358
High-Freuquency TSV Failure Analysis

Kim, Joohee; Cho, Jonghyun; Jung, Hyunsuk; Pak, Jun So; Yook, Jong-Min; Kim, Joungho; Kim, Jun Chul, 20th Conference on Electrical Performance of Electronic Packaging and Systems, EPEP 2011, 2011-10-24

20359
High-gain coefficient long-wavelength-band erbium-doped fiber amplifier using 1530-nm band pump

Choi, BH; Park, HyoHoon; Chu, M; Kim, SK, IEEE PHOTONICS TECHNOLOGY LETTERS, v.13, no.2, pp.109 - 111, 2001-02

20360
High-Gain Wide-Bandwidth Capacitor-Less Low-Dropout Regulator (LDO) for Mobile Applications Utilizing Frequency Response of Multiple Feedback Loops

Hong, Sung Wan; Cho, Gyu-Hyeong, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.63, no.1, pp.46 - 57, 2016-01

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