Browse "School of Electrical Engineering(전기및전자공학부)" by Subject nanowire

Showing results 11 to 21 of 21

11
Local Electro-Thermal Annealing for Repair of Total Ionizing Dose-Induced Damage in Gate-All-Around MOSFETs

Park, Jun-Young; Moon, Dong-Il; Bae, Hagyoul; Roh, Young Tak; Seol, Myeong-Lok; Lee, Byung-Hyun; Jeon, Chang-Hoon; et al, IEEE ELECTRON DEVICE LETTERS, v.37, no.7, pp.843 - 846, 2016-07

12
Localized Electrothermal Annealing with Nanowatt Power for a Silicon Nanowire Field-Effect Transistor

Park, Jun-Young; Lee, Byung-Hyun; Lee, Geon-Beom; Bae, Hagyoul; Choi, Yang-Kyu, ACS APPLIED MATERIALS & INTERFACES, v.10, no.5, pp.4838 - 4843, 2018-02

13
Multiple-gate CMOS thin-film transistor with polysilicon nanowire

Im, Mae-Soon; Han, Jin-Woo; Lee, Hyun-Jin; Yu, Lee-Eun; Kim, Sung-Ho; Kim, Chang-Hoon; Jeon, Sang-Cheol; et al, IEEE ELECTRON DEVICE LETTERS, v.29, no.1, pp.102 - 105, 2008-01

14
Nanowire FET Biosensors on a Bulk Silicon Substrate

Ahn, Jae-Hyuk; Kim, Jee-Yeon; Choi, Kyung-Yong; Moon, Dong-Il; Kim, Chang-Hoon; Seol, Myeong-Lok; Park, Tae-Jung; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.59, no.8, pp.2243 - 2249, 2012-08

15
Nonvolatile Memory by All-Around-Gate Junctionless Transistor Composed of Silicon Nanowire on Bulk Substrate

Choi, Sung-Jin; Moon, Dong-Il; Kim, Sung-Ho; Ahn, Jae-Hyuk; Lee, Jin-Seong; Kim, Jee-Yeon; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.32, no.5, pp.602 - 604, 2011-05

16
Quantum Simulation Study on Performance Optimization of GaSb/InAs nanowire Tunneling FET

Hur, Ji-Hyun; Jeon, Sanghun, JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.16, no.5, pp.630 - 634, 2016-10

17
Self-Curable Gate-All-Around MOSFETs Using Electrical Annealing to Repair Degradation Induced From Hot-Carrier Injection

Park, Jun-Young; Moon, Dong-Il; Seol, Myeong-Lok; Kim, Choong-Ki; Jeon, Chang-Hoon; Bae, Hagyoul; Bang, Tewook; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.63, no.3, pp.910 - 915, 2016-03

18
Simulation Study of Germanium p-Type Nanowire Schottky Barrier MOSFETs

Lee, Jaehyun; Shin, Mincheol, IEEE ELECTRON DEVICE LETTERS, v.34, no.3, pp.342 - 344, 2013-03

19
Surface-Roughness-Limited Mean Free Path in Silicon Nanowire Field Effect Transistors

Jung, Hyo-Eun; Shin, Mincheol, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.60, no.6, pp.1861 - 1866, 2013-06

20
(The) study of band structure and transport of silicon nanowire with various cross sections using finite element method = FEM을 활용한 다양한 단면을 가진 실리콘 나노와이어의 밴드 구조와 전자수송에 대한 연구link

Park, Sangchun; Shin, Mincheol; et al, 한국과학기술원, 2017

21
Theoretical study of the surface roughness scattering effects on silicon nanowire FETs = 실리콘 나노와이어 트랜지스터에서의 표면 거칠기 충돌영향에 대한 이론연구link

Jung, Hyo-Eun; 정효은; et al, 한국과학기술원, 2013

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